Britton, T., Maurice, C., Fortunier, R., Driver, J., Day, A., Meaden, G., . . . Wilkinson, A. (2010). Factors affecting the accuracy of high resolution electron backscatter diffraction when using simulated patterns.
Chicago Style (17th ed.) CitationBritton, T., C. Maurice, R. Fortunier, J. Driver, A. Day, G. Meaden, D. Dingley, K. Mingard, and A. Wilkinson. Factors Affecting the Accuracy of High Resolution Electron Backscatter Diffraction When Using Simulated Patterns. 2010.
MLA引文Britton, T., et al. Factors Affecting the Accuracy of High Resolution Electron Backscatter Diffraction When Using Simulated Patterns. 2010.
警告:這些引文格式不一定是100%准確.