APA引文

Britton, T., Maurice, C., Fortunier, R., Driver, J., Day, A., Meaden, G., . . . Wilkinson, A. (2010). Factors affecting the accuracy of high resolution electron backscatter diffraction when using simulated patterns.

芝加哥风格引文

Britton, T., C. Maurice, R. Fortunier, J. Driver, A. Day, G. Meaden, D. Dingley, K. Mingard, 与 A. Wilkinson. Factors Affecting the Accuracy of High Resolution Electron Backscatter Diffraction When Using Simulated Patterns. 2010.

MLA引文

Britton, T., et al. Factors Affecting the Accuracy of High Resolution Electron Backscatter Diffraction When Using Simulated Patterns. 2010.