$Factors affecting the accuracy of high resolution electron backscatter diffraction when using simulated patterns.$

Factors affecting the accuracy of high resolution electron backscatter diffraction when using simulated patterns.

High resolution EBSD directly compares electron backscattering patterns (EBSPs), generated in a scanning electron microscope, to measure relative strain and rotation to a precision of ∼ 10(-4) in strain and 10(-4)rad (0.006 °) in rotation. However the measurement of absolute strain and rotation requ...

書目詳細資料
Main Authors:	Britton, T, Maurice, C, Fortunier, R, Driver, J, Day, A, Meaden, G, Dingley, D, Mingard, K, Wilkinson, A
格式:	Journal article
語言:	English
出版:	2010

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