Factors affecting the accuracy of high resolution electron backscatter diffraction when using simulated patterns.
High resolution EBSD directly compares electron backscattering patterns (EBSPs), generated in a scanning electron microscope, to measure relative strain and rotation to a precision of ∼ 10(-4) in strain and 10(-4)rad (0.006 °) in rotation. However the measurement of absolute strain and rotation requ...
| Główni autorzy: | , , , , , , , , |
|---|---|
| Format: | Journal article |
| Język: | English |
| Wydane: |
2010
|