A high-yield vacuum-evaporation-based R2R-compatible fabrication route for organic electronic circuits

Advances are described in a vacuum-evaporation-based approach for the roll-to-roll (R2R) production of organic thin film transistors (TFTs) and circuits. Results from 90-transistor arrays formed directly onto a plasma-polymerised diacrylate gate dielectric are compared with those formed on polystyre...

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Asıl Yazarlar: Patchett, E, Williams, A, Ding, Z, Abbas, G, Assender, H, Morrison, J, Yeates, S, Taylor, D
Materyal Türü: Journal article
Dil:English
Baskı/Yayın Bilgisi: Elsevier 2014
_version_ 1826279254602547200
author Patchett, E
Williams, A
Ding, Z
Abbas, G
Assender, H
Morrison, J
Yeates, S
Taylor, D
author_facet Patchett, E
Williams, A
Ding, Z
Abbas, G
Assender, H
Morrison, J
Yeates, S
Taylor, D
author_sort Patchett, E
collection OXFORD
description Advances are described in a vacuum-evaporation-based approach for the roll-to-roll (R2R) production of organic thin film transistors (TFTs) and circuits. Results from 90-transistor arrays formed directly onto a plasma-polymerised diacrylate gate dielectric are compared with those formed on polystyrene-buffered diacrylate. The latter approach resulted in stable, reproducible transistors with yields in excess of 90%. The resulting TFTs had low turn-on voltage, on-off ratios ∼106 and mobility ∼1 cm2/V s in the linear regime, as expected for dinaphtho[2,3-b: 2′,3′-f] thieno[3,2-b]thiophene the air stable small molecule used as the active semiconductor. We show that when device design is constrained by the generally poor registration ability of R2R processes, parasitic source-drain currents can lead to a >50% increase in the mobility extracted from the resulting TFTs, the increases being especially marked in low channel width devices. Batches of 27 saturated-load inverters were fabricated with 100% yield and their behaviour successfully reproduced using TFT parameters extracted with Silvaco's UOTFT Model. 5- and 7-stage ring oscillator (RO) outputs ranged from ∼120 Hz to >2 kHz with rail voltages, VDD, increasing from -15 V to -90 V. From simulations an order of magnitude increase in frequency could be expected by reducing parasitic gate capacitances. During 8 h of continuous operation at VDD = -60 V, the frequency of a 7-stage RO remained almost constant at ∼1.4 kHz albeit that the output signal amplitude decreased from ∼22 V to ∼10 V. Over the next 30 days of intermittent operation further degradation in performance occurred although an unused RO showed no deterioration over the same period. © 2014 The Authors. Published by Elsevier B.V.
first_indexed 2024-03-06T23:56:00Z
format Journal article
id oxford-uuid:743db468-0c69-4f02-8dc0-11c49dea247b
institution University of Oxford
language English
last_indexed 2024-03-06T23:56:00Z
publishDate 2014
publisher Elsevier
record_format dspace
spelling oxford-uuid:743db468-0c69-4f02-8dc0-11c49dea247b2022-03-26T20:01:29ZA high-yield vacuum-evaporation-based R2R-compatible fabrication route for organic electronic circuitsJournal articlehttp://purl.org/coar/resource_type/c_dcae04bcuuid:743db468-0c69-4f02-8dc0-11c49dea247bEnglishSymplectic Elements at OxfordElsevier2014Patchett, EWilliams, ADing, ZAbbas, GAssender, HMorrison, JYeates, STaylor, DAdvances are described in a vacuum-evaporation-based approach for the roll-to-roll (R2R) production of organic thin film transistors (TFTs) and circuits. Results from 90-transistor arrays formed directly onto a plasma-polymerised diacrylate gate dielectric are compared with those formed on polystyrene-buffered diacrylate. The latter approach resulted in stable, reproducible transistors with yields in excess of 90%. The resulting TFTs had low turn-on voltage, on-off ratios ∼106 and mobility ∼1 cm2/V s in the linear regime, as expected for dinaphtho[2,3-b: 2′,3′-f] thieno[3,2-b]thiophene the air stable small molecule used as the active semiconductor. We show that when device design is constrained by the generally poor registration ability of R2R processes, parasitic source-drain currents can lead to a >50% increase in the mobility extracted from the resulting TFTs, the increases being especially marked in low channel width devices. Batches of 27 saturated-load inverters were fabricated with 100% yield and their behaviour successfully reproduced using TFT parameters extracted with Silvaco's UOTFT Model. 5- and 7-stage ring oscillator (RO) outputs ranged from ∼120 Hz to >2 kHz with rail voltages, VDD, increasing from -15 V to -90 V. From simulations an order of magnitude increase in frequency could be expected by reducing parasitic gate capacitances. During 8 h of continuous operation at VDD = -60 V, the frequency of a 7-stage RO remained almost constant at ∼1.4 kHz albeit that the output signal amplitude decreased from ∼22 V to ∼10 V. Over the next 30 days of intermittent operation further degradation in performance occurred although an unused RO showed no deterioration over the same period. © 2014 The Authors. Published by Elsevier B.V.
spellingShingle Patchett, E
Williams, A
Ding, Z
Abbas, G
Assender, H
Morrison, J
Yeates, S
Taylor, D
A high-yield vacuum-evaporation-based R2R-compatible fabrication route for organic electronic circuits
title A high-yield vacuum-evaporation-based R2R-compatible fabrication route for organic electronic circuits
title_full A high-yield vacuum-evaporation-based R2R-compatible fabrication route for organic electronic circuits
title_fullStr A high-yield vacuum-evaporation-based R2R-compatible fabrication route for organic electronic circuits
title_full_unstemmed A high-yield vacuum-evaporation-based R2R-compatible fabrication route for organic electronic circuits
title_short A high-yield vacuum-evaporation-based R2R-compatible fabrication route for organic electronic circuits
title_sort high yield vacuum evaporation based r2r compatible fabrication route for organic electronic circuits
work_keys_str_mv AT patchette ahighyieldvacuumevaporationbasedr2rcompatiblefabricationroutefororganicelectroniccircuits
AT williamsa ahighyieldvacuumevaporationbasedr2rcompatiblefabricationroutefororganicelectroniccircuits
AT dingz ahighyieldvacuumevaporationbasedr2rcompatiblefabricationroutefororganicelectroniccircuits
AT abbasg ahighyieldvacuumevaporationbasedr2rcompatiblefabricationroutefororganicelectroniccircuits
AT assenderh ahighyieldvacuumevaporationbasedr2rcompatiblefabricationroutefororganicelectroniccircuits
AT morrisonj ahighyieldvacuumevaporationbasedr2rcompatiblefabricationroutefororganicelectroniccircuits
AT yeatess ahighyieldvacuumevaporationbasedr2rcompatiblefabricationroutefororganicelectroniccircuits
AT taylord ahighyieldvacuumevaporationbasedr2rcompatiblefabricationroutefororganicelectroniccircuits
AT patchette highyieldvacuumevaporationbasedr2rcompatiblefabricationroutefororganicelectroniccircuits
AT williamsa highyieldvacuumevaporationbasedr2rcompatiblefabricationroutefororganicelectroniccircuits
AT dingz highyieldvacuumevaporationbasedr2rcompatiblefabricationroutefororganicelectroniccircuits
AT abbasg highyieldvacuumevaporationbasedr2rcompatiblefabricationroutefororganicelectroniccircuits
AT assenderh highyieldvacuumevaporationbasedr2rcompatiblefabricationroutefororganicelectroniccircuits
AT morrisonj highyieldvacuumevaporationbasedr2rcompatiblefabricationroutefororganicelectroniccircuits
AT yeatess highyieldvacuumevaporationbasedr2rcompatiblefabricationroutefororganicelectroniccircuits
AT taylord highyieldvacuumevaporationbasedr2rcompatiblefabricationroutefororganicelectroniccircuits