Dyfyniad APA

Sun, Y., Chockler, H., Huang, X., & Kroening, D. (2020). Explaining image classifiers using statistical fault localization. Springer.

Dyfyniad Arddull Chicago

Sun, Y., H. Chockler, X. Huang, and D. Kroening. Explaining Image Classifiers Using Statistical Fault Localization. Springer, 2020.

Dyfyniad MLA

Sun, Y., et al. Explaining Image Classifiers Using Statistical Fault Localization. Springer, 2020.

Rhybudd: Mae'n bosib nad yw'r dyfyniadau hyn bob amser yn 100% cywir.