APA ציטוט

Sun, Y., Chockler, H., Huang, X., & Kroening, D. (2020). Explaining image classifiers using statistical fault localization. Springer.

Chicago Style (17th ed.) Citation

Sun, Y., H. Chockler, X. Huang, and D. Kroening. Explaining Image Classifiers Using Statistical Fault Localization. Springer, 2020.

ציטוט MLA

Sun, Y., et al. Explaining Image Classifiers Using Statistical Fault Localization. Springer, 2020.