Sun, Y., Chockler, H., Huang, X., & Kroening, D. (2020). Explaining image classifiers using statistical fault localization. Springer.
Čikaški stil citiranja (17. izdanje)Sun, Y., H. Chockler, X. Huang, i D. Kroening. Explaining Image Classifiers Using Statistical Fault Localization. Springer, 2020.
MLA način citiranja (9. izdanje)Sun, Y., et al. Explaining Image Classifiers Using Statistical Fault Localization. Springer, 2020.
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