Sun, Y., Chockler, H., Huang, X., & Kroening, D. (2020). Explaining image classifiers using statistical fault localization. Springer.
Chicago-čujuhus (17. p.)Sun, Y., H. Chockler, X. Huang, juo D. Kroening. Explaining Image Classifiers Using Statistical Fault Localization. Springer, 2020.
MLA-čujuhus (9. p.)Sun, Y., et al. Explaining Image Classifiers Using Statistical Fault Localization. Springer, 2020.
Muitte dárkkistit čujuhemiid riektatvuođa, ovdal go geavahat daid iežat deavsttas.