APA引文

Sun, Y., Chockler, H., Huang, X., & Kroening, D. (2020). Explaining image classifiers using statistical fault localization. Springer.

芝加哥风格引文

Sun, Y., H. Chockler, X. Huang, 与 D. Kroening. Explaining Image Classifiers Using Statistical Fault Localization. Springer, 2020.

MLA引文

Sun, Y., et al. Explaining Image Classifiers Using Statistical Fault Localization. Springer, 2020.

警告：这些引文格式不一定是100％准确.