Explaining image classifiers using statistical fault localization
The black-box nature of deep neural networks (DNNs) makes it impossible to understand why a particular output is produced, creating demand for “Explainable AI”. In this paper, we show that statistical fault localization (SFL) techniques from software engineering deliver high quality explanations of...
| Main Authors: | , , , |
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| 格式: | Conference item |
| 语言: | English |
| 出版: |
Springer
2020
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