Explaining image classifiers using statistical fault localization

Explaining image classifiers using statistical fault localization

The black-box nature of deep neural networks (DNNs) makes it impossible to understand why a particular output is produced, creating demand for “Explainable AI”. In this paper, we show that statistical fault localization (SFL) techniques from software engineering deliver high quality explanations of...

Podrobná bibliografie
Hlavní autoři:	Sun, Y, Chockler, H, Huang, X, Kroening, D
Médium:	Conference item
Jazyk:	English
Vydáno:	Springer 2020

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