Explaining image classifiers using statistical fault localization

The black-box nature of deep neural networks (DNNs) makes it impossible to understand why a particular output is produced, creating demand for “Explainable AI”. In this paper, we show that statistical fault localization (SFL) techniques from software engineering deliver high quality explanations of...

Description complète

Détails bibliographiques
Auteurs principaux: Sun, Y, Chockler, H, Huang, X, Kroening, D
Format: Conference item
Langue:English
Publié: Springer 2020

Documents similaires