Explaining image classifiers using statistical fault localization

Explaining image classifiers using statistical fault localization

The black-box nature of deep neural networks (DNNs) makes it impossible to understand why a particular output is produced, creating demand for “Explainable AI”. In this paper, we show that statistical fault localization (SFL) techniques from software engineering deliver high quality explanations of...

書目詳細資料
Main Authors:	Sun, Y, Chockler, H, Huang, X, Kroening, D
格式:	Conference item
語言:	English
出版:	Springer 2020

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