On the measurement and interpretation of residual stress at the micro-scale
In the present paper we consider two representative methods for residual stress evaluation at the micro-scale: a (semi-)destructive method involving material removal and the measurement of strain relief; and a non-destructive X-ray diffraction technique involving the use of micro-focused synchrotron...
| Main Authors: | , , , , |
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| Format: | Journal article |
| Language: | English |
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World Scientific Publishing Company
2010
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| _version_ | 1797076260231315456 |
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| author | Korsunsky, A Bemporad, E Sebastiani, M Hofmann, F Dave, S |
| author_facet | Korsunsky, A Bemporad, E Sebastiani, M Hofmann, F Dave, S |
| author_sort | Korsunsky, A |
| collection | OXFORD |
| description | In the present paper we consider two representative methods for residual stress evaluation at the micro-scale: a (semi-)destructive method involving material removal and the measurement of strain relief; and a non-destructive X-ray diffraction technique involving the use of micro-focused synchrotron X-ray beam. A recently developed strain relief approach is described using a Focused Ion Beam (FIB) to create a circular trench of progressively increasing depth around a circular "island". Residual stress is evaluated by the comparison of the strain relief (measured by digital correlation of displacements or strains) with Finite Element simulations. The technique is illustrated for a thin TiN coating layer. The second approach uses focused synchrotron X-ray beams for white beam Laue diffraction. Demonstration experiments described involve in situ loading of commercially pure nickel foil. Procedures for validation and improvement of accuracy are discussed. |
| first_indexed | 2024-03-07T00:01:36Z |
| format | Journal article |
| id | oxford-uuid:7624d17d-69e2-4321-9c8c-c4100306afd6 |
| institution | University of Oxford |
| language | English |
| last_indexed | 2024-03-07T00:01:36Z |
| publishDate | 2010 |
| publisher | World Scientific Publishing Company |
| record_format | dspace |
| spelling | oxford-uuid:7624d17d-69e2-4321-9c8c-c4100306afd62022-03-26T20:13:47ZOn the measurement and interpretation of residual stress at the micro-scaleJournal articlehttp://purl.org/coar/resource_type/c_dcae04bcuuid:7624d17d-69e2-4321-9c8c-c4100306afd6Engineering & allied sciencesEnglishOxford University Research Archive - ValetWorld Scientific Publishing Company2010Korsunsky, ABemporad, ESebastiani, MHofmann, FDave, SIn the present paper we consider two representative methods for residual stress evaluation at the micro-scale: a (semi-)destructive method involving material removal and the measurement of strain relief; and a non-destructive X-ray diffraction technique involving the use of micro-focused synchrotron X-ray beam. A recently developed strain relief approach is described using a Focused Ion Beam (FIB) to create a circular trench of progressively increasing depth around a circular "island". Residual stress is evaluated by the comparison of the strain relief (measured by digital correlation of displacements or strains) with Finite Element simulations. The technique is illustrated for a thin TiN coating layer. The second approach uses focused synchrotron X-ray beams for white beam Laue diffraction. Demonstration experiments described involve in situ loading of commercially pure nickel foil. Procedures for validation and improvement of accuracy are discussed. |
| spellingShingle | Engineering & allied sciences Korsunsky, A Bemporad, E Sebastiani, M Hofmann, F Dave, S On the measurement and interpretation of residual stress at the micro-scale |
| title | On the measurement and interpretation of residual stress at the micro-scale |
| title_full | On the measurement and interpretation of residual stress at the micro-scale |
| title_fullStr | On the measurement and interpretation of residual stress at the micro-scale |
| title_full_unstemmed | On the measurement and interpretation of residual stress at the micro-scale |
| title_short | On the measurement and interpretation of residual stress at the micro-scale |
| title_sort | on the measurement and interpretation of residual stress at the micro scale |
| topic | Engineering & allied sciences |
| work_keys_str_mv | AT korsunskya onthemeasurementandinterpretationofresidualstressatthemicroscale AT bemporade onthemeasurementandinterpretationofresidualstressatthemicroscale AT sebastianim onthemeasurementandinterpretationofresidualstressatthemicroscale AT hofmannf onthemeasurementandinterpretationofresidualstressatthemicroscale AT daves onthemeasurementandinterpretationofresidualstressatthemicroscale |