On the measurement and interpretation of residual stress at the micro-scale
In the present paper we consider two representative methods for residual stress evaluation at the micro-scale: a (semi-)destructive method involving material removal and the measurement of strain relief; and a non-destructive X-ray diffraction technique involving the use of micro-focused synchrotron...
| Main Authors: | , , , , |
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| פורמט: | Journal article |
| שפה: | English |
| יצא לאור: |
World Scientific Publishing Company
2010
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| נושאים: |