Spin-dependent recombination in Czochralski silicon containing oxide precipitates
Electrically detected magnetic resonance is used to identify recombination centers in a set of Czochralski-grown silicon samples processed to contain strained oxide precipitates with a wide range of densities (∼ 1×10 9 cm -3 to ∼ 7×10 10 cm -3). Measurements reveal that photo-excited charge carriers...
| Autores principales: | , , , |
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| Formato: | Journal article |
| Lenguaje: | English |
| Publicado: |
2012
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