Elastic mapping of heterogeneous nanostructures with ultrasonic force microscopy (UFM)
Ultrasonic force microscopy (UFM) is an atomic force microscopy (AFM)-related technique originally introduced to study the surface elastic properties of stiff materials. We report elastic images of heterogeneous nanostructures with a lateral resolution of the order of a few nanometres. One of the ma...
| Main Authors: | , , , , |
|---|---|
| Format: | Conference item |
| Published: |
1999
|