Elastic mapping of heterogeneous nanostructures with ultrasonic force microscopy (UFM)
Ultrasonic force microscopy (UFM) is an atomic force microscopy (AFM)-related technique originally introduced to study the surface elastic properties of stiff materials. We report elastic images of heterogeneous nanostructures with a lateral resolution of the order of a few nanometres. One of the ma...
Main Authors: | Dinelli, F, Assender, H, Takeda, N, Briggs, G, Kolosov, O |
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Format: | Conference item |
Published: |
1999
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