Probe integrated scattering cross sections in the analysis of atomic resolution HAADF STEM images.

Probe integrated scattering cross sections in the analysis of atomic resolution HAADF STEM images.

The physical basis for using a probe-position integrated cross section (PICS) for a single column of atoms as an effective way to compare simulation and experiment in high-angle annular dark-field (HAADF) scanning transmission electron microscopy (STEM) is described, and the use of PICS in order to...

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Bibliographic Details
Main Authors:	E, H, Macarthur, K, Pennycook, T, Okunishi, E, D'Alfonso, A, Lugg, N, Allen, L, Nellist, P
Format:	Journal article
Language:	English
Published:	2013

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