Dinelli, F., Biswas, S., Briggs, G., & Kolosov, O. (2000). Measurements of stiff-material compliance on the nanoscale using ultrasonic force microscopy.
Chicago Style (17th ed.) CitationDinelli, F., S. Biswas, G. Briggs, and O. Kolosov. Measurements of Stiff-material Compliance on the Nanoscale Using Ultrasonic Force Microscopy. 2000.
MLA引文Dinelli, F., et al. Measurements of Stiff-material Compliance on the Nanoscale Using Ultrasonic Force Microscopy. 2000.
警告:這些引文格式不一定是100%准確.