Measurements of stiff-material compliance on the nanoscale using ultrasonic force microscopy

Measurements of stiff-material compliance on the nanoscale using ultrasonic force microscopy

Bibliografiset tiedot
Päätekijät:	Dinelli, F, Biswas, S, Briggs, G, Kolosov, O
Aineistotyyppi:	Journal article
Julkaistu:	2000

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