Measurements of stiff-material compliance on the nanoscale using ultrasonic force microscopy
Main Authors: | Dinelli, F, Biswas, S, Briggs, G, Kolosov, O |
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Format: | Journal article |
Udgivet: |
2000
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Lignende værker
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Mapping surface elastic properties of stiff and compliant materials on the nanoscale using ultrasonic force microscopy
af: Dinelli, F, et al.
Udgivet: (2000) -
Nanoscale imaging of mechanical properties by ultrasonic force microscopy (UFM)
af: Kolosov, O, et al.
Udgivet: (1996) -
Characterisation of the nanometer-scale mechanical compliance of semiconductors by Ultrasonic Force Microscopy
af: Huey, B, et al.
Udgivet: (2001) -
Elastic mapping of heterogeneous nanostructures with ultrasonic force microscopy (UFM)
af: Dinelli, F, et al.
Udgivet: (1999) -
Elastic mapping of heterogeneous nanostructures with ultrasonic force microscopy (UFM)
af: Dinelli, F, et al.
Udgivet: (1999)