Measurements of stiff-material compliance on the nanoscale using ultrasonic force microscopy

समान संसाधन

• Mapping surface elastic properties of stiff and compliant materials on the nanoscale using ultrasonic force microscopy
  द्वारा: Dinelli, F, और अन्य
  प्रकाशित: (2000)
• Nanoscale imaging of mechanical properties by ultrasonic force microscopy (UFM)
  द्वारा: Kolosov, O, और अन्य
  प्रकाशित: (1996)
• Characterisation of the nanometer-scale mechanical compliance of semiconductors by Ultrasonic Force Microscopy
  द्वारा: Huey, B, और अन्य
  प्रकाशित: (2001)
• Elastic mapping of heterogeneous nanostructures with ultrasonic force microscopy (UFM)
  द्वारा: Dinelli, F, और अन्य
  प्रकाशित: (1999)
• Elastic mapping of heterogeneous nanostructures with ultrasonic force microscopy (UFM)
  द्वारा: Dinelli, F, और अन्य
  प्रकाशित: (1999)