Cita APA (7a ed.)

Hao, X., Antonello, J., Allgeyer, E., Bewersdorf, J., & Booth, M. (2017). Aberrations in 4Pi microscopy. Optical Society.

Cita Chicago Style (17a ed.)

Hao, X., J. Antonello, E. Allgeyer, J. Bewersdorf, y M. Booth. Aberrations in 4Pi Microscopy. Optical Society, 2017.

Cita MLA (9a ed.)

Hao, X., et al. Aberrations in 4Pi Microscopy. Optical Society, 2017.