Measuring Local Mechanical Properties Using FIB Machined Microcantilevers

Measuring Local Mechanical Properties Using FIB Machined Microcantilevers

Micro-scale Focused Ion Beam (FIB) machined cantilevers were manufactured in single crystal copper, polycrystalline copper and a copper-bismuth alloy. These were imaged and tested in bending using a nanoindenter. Cantilevers machined inside a single grain of polycrystalline copper were tested to det...

書誌詳細
主要な著者:	Armstrong, D, Wilkinson, A, Roberts, S
フォーマット:	Conference item
出版事項:	2009

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