A guide on FIB preparation of samples containing stress corrosion crack tips for TEM and atom-probe analysis
The preparation of samples containing stress corrosion crack tips for 3D atom-probe tomography and transmission electron microscopy is of ultimate importance for understanding the mechanisms controlling crack propagation. In this paper, it will be shown that a focused ion beam machine equipped with...
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| Format: | Journal article |
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2008
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| _version_ | 1826280743916011520 |
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| author | Lozano-Perez, S |
| author_facet | Lozano-Perez, S |
| author_sort | Lozano-Perez, S |
| collection | OXFORD |
| description | The preparation of samples containing stress corrosion crack tips for 3D atom-probe tomography and transmission electron microscopy is of ultimate importance for understanding the mechanisms controlling crack propagation. In this paper, it will be shown that a focused ion beam machine equipped with an in situ micromanipulator is an ideal tool to systematically prepare such demanding samples. The methodology is described and discussed in detail, and several results are presented to demonstrate the potential of the technique. © 2007 Elsevier Ltd. All rights reserved. |
| first_indexed | 2024-03-07T00:18:18Z |
| format | Journal article |
| id | oxford-uuid:7b9ccd92-32fa-42b3-a603-a555cf1ef8a0 |
| institution | University of Oxford |
| last_indexed | 2024-03-07T00:18:18Z |
| publishDate | 2008 |
| record_format | dspace |
| spelling | oxford-uuid:7b9ccd92-32fa-42b3-a603-a555cf1ef8a02022-03-26T20:51:53ZA guide on FIB preparation of samples containing stress corrosion crack tips for TEM and atom-probe analysisJournal articlehttp://purl.org/coar/resource_type/c_dcae04bcuuid:7b9ccd92-32fa-42b3-a603-a555cf1ef8a0Symplectic Elements at Oxford2008Lozano-Perez, SThe preparation of samples containing stress corrosion crack tips for 3D atom-probe tomography and transmission electron microscopy is of ultimate importance for understanding the mechanisms controlling crack propagation. In this paper, it will be shown that a focused ion beam machine equipped with an in situ micromanipulator is an ideal tool to systematically prepare such demanding samples. The methodology is described and discussed in detail, and several results are presented to demonstrate the potential of the technique. © 2007 Elsevier Ltd. All rights reserved. |
| spellingShingle | Lozano-Perez, S A guide on FIB preparation of samples containing stress corrosion crack tips for TEM and atom-probe analysis |
| title | A guide on FIB preparation of samples containing stress corrosion crack tips for TEM and atom-probe analysis |
| title_full | A guide on FIB preparation of samples containing stress corrosion crack tips for TEM and atom-probe analysis |
| title_fullStr | A guide on FIB preparation of samples containing stress corrosion crack tips for TEM and atom-probe analysis |
| title_full_unstemmed | A guide on FIB preparation of samples containing stress corrosion crack tips for TEM and atom-probe analysis |
| title_short | A guide on FIB preparation of samples containing stress corrosion crack tips for TEM and atom-probe analysis |
| title_sort | guide on fib preparation of samples containing stress corrosion crack tips for tem and atom probe analysis |
| work_keys_str_mv | AT lozanoperezs aguideonfibpreparationofsamplescontainingstresscorrosioncracktipsfortemandatomprobeanalysis AT lozanoperezs guideonfibpreparationofsamplescontainingstresscorrosioncracktipsfortemandatomprobeanalysis |