A guide on FIB preparation of samples containing stress corrosion crack tips for TEM and atom-probe analysis
The preparation of samples containing stress corrosion crack tips for 3D atom-probe tomography and transmission electron microscopy is of ultimate importance for understanding the mechanisms controlling crack propagation. In this paper, it will be shown that a focused ion beam machine equipped with...
| Päätekijä: | |
|---|---|
| Aineistotyyppi: | Journal article |
| Julkaistu: |
2008
|