A guide on FIB preparation of samples containing stress corrosion crack tips for TEM and atom-probe analysis

A guide on FIB preparation of samples containing stress corrosion crack tips for TEM and atom-probe analysis

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The preparation of samples containing stress corrosion crack tips for 3D atom-probe tomography and transmission electron microscopy is of ultimate importance for understanding the mechanisms controlling crack propagation. In this paper, it will be shown that a focused ion beam machine equipped with...

書目詳細資料
主要作者:	Lozano-Perez, S
格式:	Journal article
出版:	2008

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