A guide on FIB preparation of samples containing stress corrosion crack tips for TEM and atom-probe analysis
The preparation of samples containing stress corrosion crack tips for 3D atom-probe tomography and transmission electron microscopy is of ultimate importance for understanding the mechanisms controlling crack propagation. In this paper, it will be shown that a focused ion beam machine equipped with...
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| বিন্যাস: | Journal article |
| প্রকাশিত: |
2008
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