APPLICATION OF A POSITION-SENSITIVE ATOM PROBE TO THE ANALYSIS OF THE CHEMISTRY AND MORPHOLOGY OF MULTI-QUANTUM-WELL INTERFACES

APPLICATION OF A POSITION-SENSITIVE ATOM PROBE TO THE ANALYSIS OF THE CHEMISTRY AND MORPHOLOGY OF MULTI-QUANTUM-WELL INTERFACES

Sonraí bibleagrafaíochta
Príomhchruthaitheoirí:	Cerezo, A, Liddle, J, Grovenor, C, Norman, A, Smith, G
Formáid:	Conference item
Foilsithe / Cruthaithe:	1989

Míreanna comhchosúla

APPLICATION OF POSITION-SENSITIVE ATOM PROBE TO THE STUDY OF THE MICROCHEMISTRY AND MORPHOLOGY OF QUANTUM WELL INTERFACES
de réir: Liddle, J, et al.
Foilsithe / Cruthaithe: (1989)

POSITION-SENSITIVE ATOM PROBE ANALYSIS OF MULTI-QUANTUM-WELL STRUCTURES
de réir: Liddle, J, et al.
Foilsithe / Cruthaithe: (1989)

POSITION-SENSITIVE ATOM PROBE ANALYSIS OF MULTIPLE QUANTUM-WELL STRUCTURES
de réir: Cerezo, A, et al.
Foilsithe / Cruthaithe: (1989)

POSITION-SENSITIVE ATOM PROBE ANALYSIS OF MULTIPLE QUANTUM-WELL STRUCTURES
de réir: Cerezo, A, et al.
Foilsithe / Cruthaithe: (1989)

POSITION-SENSITIVE ATOM PROBE AND STEM ANALYSIS OF THE MICROCHEMISTRY OF GAINAS/INP QUANTUM WELLS
de réir: Liddle, J, et al.
Foilsithe / Cruthaithe: (1989)

MATERIALS ANALYSIS WITH A POSITION-SENSITIVE ATOM PROBE
de réir: Cerezo, A, et al.
Foilsithe / Cruthaithe: (1989)

SURFACE-ANALYSIS WITH A POSITION-SENSITIVE ATOM PROBE
de réir: Cerezo, A, et al.
Foilsithe / Cruthaithe: (1989)

THE POSITION-SENSITIVE ATOM PROBE - RECONSTRUCTION OF THE ATOMIC CHEMISTRY OF SOLIDS IN 3-DIMENSIONS (SUMMARY)
de réir: Cerezo, A, et al.
Foilsithe / Cruthaithe: (1991)

ULTRA-HIGH-RESOLUTION CHEMICAL-ANALYSIS BY FIELD-ION MICROSCOPY, ATOM PROBE AND POSITION-SENSITIVE ATOM-PROBE TECHNIQUES
de réir: Grovenor, C, et al.
Foilsithe / Cruthaithe: (1992)

PULSED LASER ATOM PROBE ANALYSIS OF SEMICONDUCTOR-MATERIALS
de réir: Grovenor, C, et al.
Foilsithe / Cruthaithe: (1987)

PULSED LASER ATOM PROBE ANALYSIS OF TERNARY AND QUATERNARY III-V EPITAXIAL LAYERS
de réir: Liddle, J, et al.
Foilsithe / Cruthaithe: (1988)

STRUCTURAL-ANALYSIS WITH THE POSITION-SENSITIVE ATOM PROBE
de réir: Hetherington, M, et al.
Foilsithe / Cruthaithe: (1992)

ATOMIC SCALE CHEMISTRY OF CO- AND NI-SI(100) INTERFACES
de réir: Cerezo, A, et al.
Foilsithe / Cruthaithe: (1991)

ATOMIC SCALE CHEMISTRY OF CO- AND NI-SI(100) INTERFACES
de réir: Cerezo, A, et al.
Foilsithe / Cruthaithe: (1991)

DEVELOPMENT AND INITIAL APPLICATIONS OF A POSITION-SENSITIVE ATOM PROBE
de réir: Cerezo, A, et al.
Foilsithe / Cruthaithe: (1988)

APPLICATION OF A POSITION-SENSITIVE DETECTOR TO ATOM PROBE MICROANALYSIS
de réir: Cerezo, A, et al.
Foilsithe / Cruthaithe: (1988)

PULSED LASER ATOM PROBE ANALYSIS OF III-V COMPOUND SEMICONDUCTOR EPILAYERS
de réir: Mackenzie, R, et al.
Foilsithe / Cruthaithe: (1990)

RECENT DEVELOPMENTS IN POSITION-SENSITIVE ATOM-PROBE MICROANALYSIS
de réir: Smith, G, et al.
Foilsithe / Cruthaithe: (1994)

LATERAL AND DEPTH SCALE CALIBRATION OF THE POSITION-SENSITIVE ATOM-PROBE
de réir: Hyde, J, et al.
Foilsithe / Cruthaithe: (1994)

3-DIMENSIONAL VISUALIZATION OF SEMICONDUCTOR MULTI-QUANTUM-WELL INTERFACES
de réir: Mackenzie, R, et al.
Foilsithe / Cruthaithe: (1991)

3-DIMENSIONAL VISUALIZATION OF SEMICONDUCTOR MULTI-QUANTUM-WELL INTERFACES
de réir: Mackenzie, R, et al.
Foilsithe / Cruthaithe: (1991)

Three dimensional visualization of semiconductor multi-quantum well interfaces
de réir: Mackenzie, R, et al.
Foilsithe / Cruthaithe: (1991)

3D atom probe analysis of quantum well and quantum dot materials
de réir: Cerezo, A, et al.
Foilsithe / Cruthaithe: (2007)

RECENT DEVELOPMENTS IN THE STUDY OF SEMICONDUCTORS BY ATOM PROBE MICROANALYSIS.
de réir: Grovenor, C, et al.
Foilsithe / Cruthaithe: (1985)

PULSED LASER ATOM PROBE ANALYSIS OF GAAS AND INAS
de réir: Cerezo, A, et al.
Foilsithe / Cruthaithe: (1985)

PULSED LASER ATOM PROBE ANALYSIS OF SEMICONDUCTOR-MATERIALS
de réir: Cerezo, A, et al.
Foilsithe / Cruthaithe: (1986)

Studies of boundaries and interfaces on the atomic scale by atom probe FIM
de réir: Smith, G, et al.
Foilsithe / Cruthaithe: (1998)

RECENT DEVELOPMENTS IN ATOM PROBE MICROANALYSIS OF MATERIALS WITH ULTRAFINE MICROSTRUCTURES
de réir: Grovenor, C, et al.
Foilsithe / Cruthaithe: (1990)

RECENT DEVELOPMENTS IN ATOM PROBE MICROANALYSIS OF MATERIALS WITH ULTRAFINE MICROSTRUCTURES
de réir: Grovenor, C, et al.
Foilsithe / Cruthaithe: (1990)

INVESTIGATIONS OF METAL-SILICON INTERFACES BY TIME-OF-FLIGHT ATOM PROBE.
de réir: Grovenor, C, et al.
Foilsithe / Cruthaithe: (1983)

FIELD-ION MICROSCOPY AND ATOM PROBE MICROANALYSIS OF SEMICONDUCTOR-MATERIALS
de réir: Grovenor, C, et al.
Foilsithe / Cruthaithe: (1983)

1990 BURCH,C.R. PRIZE - JOINT AWARD - THE POSITION-SENSITIVE ATOM PROBE
de réir: Cerezo, A
Foilsithe / Cruthaithe: (1991)

PULSED LASER ATOM PROBE ANALYSIS OF III-V COMPOUND SEMICONDUCTORS
de réir: Cerezo, A, et al.
Foilsithe / Cruthaithe: (1986)

ATOM PROBE ANALYSIS OF A CERAMIC OXIDE SUPERCONDUCTOR
de réir: Cerezo, A, et al.
Foilsithe / Cruthaithe: (1988)

ATOM PROBE ANALYSIS AND MODELING OF INTERFACES IN MAGNETIC MULTILAYERS
de réir: Petfordlong, A, et al.
Foilsithe / Cruthaithe: (1992)

POSITION-SENSITIVE ATOM-PROBE STUDY OF THE DECOMPOSITION OF A CU-2.6AT-PERCENT-CO ALLOY
de réir: Setna, R, et al.
Foilsithe / Cruthaithe: (1993)

ATOM PROBE STUDIES OF THE COMPOSITION OF LOW-TEMPERATURE OXIDES ON (100) SILICON AND GALLIUM-ARSENIDE SURFACES
de réir: Grovenor, C, et al.
Foilsithe / Cruthaithe: (1989)

ULTRAHIGH RESOLUTION CHARACTERIZATION OF COMPOUND SEMICONDUCTORS USING PULSED LASER ATOM PROBE TECHNIQUES
de réir: Mackenzie, R, et al.
Foilsithe / Cruthaithe: (1991)

ANALYSIS OF NANOMETER-SIZED PRECIPITATES USING ATOM PROBE TECHNIQUES
de réir: Cerezo, A, et al.
Foilsithe / Cruthaithe: (1990)

POSITION-SENSITIVE ATOM PROBE STUDIES OF THE COMPOSITION OF OMEGA AND THETA' PRECIPITATES IN AL-CU-MG-AG ALLOYS
de réir: Grovenor, C, et al.
Foilsithe / Cruthaithe: (1989)