APPLICATION OF A POSITION-SENSITIVE ATOM PROBE TO THE ANALYSIS OF THE CHEMISTRY AND MORPHOLOGY OF MULTI-QUANTUM-WELL INTERFACES

APPLICATION OF A POSITION-SENSITIVE ATOM PROBE TO THE ANALYSIS OF THE CHEMISTRY AND MORPHOLOGY OF MULTI-QUANTUM-WELL INTERFACES

Λεπτομέρειες βιβλιογραφικής εγγραφής
Κύριοι συγγραφείς:	Cerezo, A, Liddle, J, Grovenor, C, Norman, A, Smith, G
Μορφή:	Conference item
Έκδοση:	1989

Παρόμοια τεκμήρια

APPLICATION OF POSITION-SENSITIVE ATOM PROBE TO THE STUDY OF THE MICROCHEMISTRY AND MORPHOLOGY OF QUANTUM WELL INTERFACES
ανά: Liddle, J, κ.ά.
Έκδοση: (1989)

POSITION-SENSITIVE ATOM PROBE ANALYSIS OF MULTI-QUANTUM-WELL STRUCTURES
ανά: Liddle, J, κ.ά.
Έκδοση: (1989)

POSITION-SENSITIVE ATOM PROBE ANALYSIS OF MULTIPLE QUANTUM-WELL STRUCTURES
ανά: Cerezo, A, κ.ά.
Έκδοση: (1989)

POSITION-SENSITIVE ATOM PROBE ANALYSIS OF MULTIPLE QUANTUM-WELL STRUCTURES
ανά: Cerezo, A, κ.ά.
Έκδοση: (1989)

POSITION-SENSITIVE ATOM PROBE AND STEM ANALYSIS OF THE MICROCHEMISTRY OF GAINAS/INP QUANTUM WELLS
ανά: Liddle, J, κ.ά.
Έκδοση: (1989)

MATERIALS ANALYSIS WITH A POSITION-SENSITIVE ATOM PROBE
ανά: Cerezo, A, κ.ά.
Έκδοση: (1989)

SURFACE-ANALYSIS WITH A POSITION-SENSITIVE ATOM PROBE
ανά: Cerezo, A, κ.ά.
Έκδοση: (1989)

THE POSITION-SENSITIVE ATOM PROBE - RECONSTRUCTION OF THE ATOMIC CHEMISTRY OF SOLIDS IN 3-DIMENSIONS (SUMMARY)
ανά: Cerezo, A, κ.ά.
Έκδοση: (1991)

ULTRA-HIGH-RESOLUTION CHEMICAL-ANALYSIS BY FIELD-ION MICROSCOPY, ATOM PROBE AND POSITION-SENSITIVE ATOM-PROBE TECHNIQUES
ανά: Grovenor, C, κ.ά.
Έκδοση: (1992)

PULSED LASER ATOM PROBE ANALYSIS OF SEMICONDUCTOR-MATERIALS
ανά: Grovenor, C, κ.ά.
Έκδοση: (1987)

PULSED LASER ATOM PROBE ANALYSIS OF TERNARY AND QUATERNARY III-V EPITAXIAL LAYERS
ανά: Liddle, J, κ.ά.
Έκδοση: (1988)

STRUCTURAL-ANALYSIS WITH THE POSITION-SENSITIVE ATOM PROBE
ανά: Hetherington, M, κ.ά.
Έκδοση: (1992)

ATOMIC SCALE CHEMISTRY OF CO- AND NI-SI(100) INTERFACES
ανά: Cerezo, A, κ.ά.
Έκδοση: (1991)

ATOMIC SCALE CHEMISTRY OF CO- AND NI-SI(100) INTERFACES
ανά: Cerezo, A, κ.ά.
Έκδοση: (1991)

DEVELOPMENT AND INITIAL APPLICATIONS OF A POSITION-SENSITIVE ATOM PROBE
ανά: Cerezo, A, κ.ά.
Έκδοση: (1988)

APPLICATION OF A POSITION-SENSITIVE DETECTOR TO ATOM PROBE MICROANALYSIS
ανά: Cerezo, A, κ.ά.
Έκδοση: (1988)

PULSED LASER ATOM PROBE ANALYSIS OF III-V COMPOUND SEMICONDUCTOR EPILAYERS
ανά: Mackenzie, R, κ.ά.
Έκδοση: (1990)

RECENT DEVELOPMENTS IN POSITION-SENSITIVE ATOM-PROBE MICROANALYSIS
ανά: Smith, G, κ.ά.
Έκδοση: (1994)

LATERAL AND DEPTH SCALE CALIBRATION OF THE POSITION-SENSITIVE ATOM-PROBE
ανά: Hyde, J, κ.ά.
Έκδοση: (1994)

3-DIMENSIONAL VISUALIZATION OF SEMICONDUCTOR MULTI-QUANTUM-WELL INTERFACES
ανά: Mackenzie, R, κ.ά.
Έκδοση: (1991)

3-DIMENSIONAL VISUALIZATION OF SEMICONDUCTOR MULTI-QUANTUM-WELL INTERFACES
ανά: Mackenzie, R, κ.ά.
Έκδοση: (1991)

Three dimensional visualization of semiconductor multi-quantum well interfaces
ανά: Mackenzie, R, κ.ά.
Έκδοση: (1991)

3D atom probe analysis of quantum well and quantum dot materials
ανά: Cerezo, A, κ.ά.
Έκδοση: (2007)

RECENT DEVELOPMENTS IN THE STUDY OF SEMICONDUCTORS BY ATOM PROBE MICROANALYSIS.
ανά: Grovenor, C, κ.ά.
Έκδοση: (1985)

PULSED LASER ATOM PROBE ANALYSIS OF GAAS AND INAS
ανά: Cerezo, A, κ.ά.
Έκδοση: (1985)

PULSED LASER ATOM PROBE ANALYSIS OF SEMICONDUCTOR-MATERIALS
ανά: Cerezo, A, κ.ά.
Έκδοση: (1986)

Studies of boundaries and interfaces on the atomic scale by atom probe FIM
ανά: Smith, G, κ.ά.
Έκδοση: (1998)

RECENT DEVELOPMENTS IN ATOM PROBE MICROANALYSIS OF MATERIALS WITH ULTRAFINE MICROSTRUCTURES
ανά: Grovenor, C, κ.ά.
Έκδοση: (1990)

RECENT DEVELOPMENTS IN ATOM PROBE MICROANALYSIS OF MATERIALS WITH ULTRAFINE MICROSTRUCTURES
ανά: Grovenor, C, κ.ά.
Έκδοση: (1990)

INVESTIGATIONS OF METAL-SILICON INTERFACES BY TIME-OF-FLIGHT ATOM PROBE.
ανά: Grovenor, C, κ.ά.
Έκδοση: (1983)

FIELD-ION MICROSCOPY AND ATOM PROBE MICROANALYSIS OF SEMICONDUCTOR-MATERIALS
ανά: Grovenor, C, κ.ά.
Έκδοση: (1983)

1990 BURCH,C.R. PRIZE - JOINT AWARD - THE POSITION-SENSITIVE ATOM PROBE
ανά: Cerezo, A
Έκδοση: (1991)

PULSED LASER ATOM PROBE ANALYSIS OF III-V COMPOUND SEMICONDUCTORS
ανά: Cerezo, A, κ.ά.
Έκδοση: (1986)

ATOM PROBE ANALYSIS OF A CERAMIC OXIDE SUPERCONDUCTOR
ανά: Cerezo, A, κ.ά.
Έκδοση: (1988)

ATOM PROBE ANALYSIS AND MODELING OF INTERFACES IN MAGNETIC MULTILAYERS
ανά: Petfordlong, A, κ.ά.
Έκδοση: (1992)

POSITION-SENSITIVE ATOM-PROBE STUDY OF THE DECOMPOSITION OF A CU-2.6AT-PERCENT-CO ALLOY
ανά: Setna, R, κ.ά.
Έκδοση: (1993)

ATOM PROBE STUDIES OF THE COMPOSITION OF LOW-TEMPERATURE OXIDES ON (100) SILICON AND GALLIUM-ARSENIDE SURFACES
ανά: Grovenor, C, κ.ά.
Έκδοση: (1989)

ULTRAHIGH RESOLUTION CHARACTERIZATION OF COMPOUND SEMICONDUCTORS USING PULSED LASER ATOM PROBE TECHNIQUES
ανά: Mackenzie, R, κ.ά.
Έκδοση: (1991)

ANALYSIS OF NANOMETER-SIZED PRECIPITATES USING ATOM PROBE TECHNIQUES
ανά: Cerezo, A, κ.ά.
Έκδοση: (1990)

POSITION-SENSITIVE ATOM PROBE STUDIES OF THE COMPOSITION OF OMEGA AND THETA' PRECIPITATES IN AL-CU-MG-AG ALLOYS
ανά: Grovenor, C, κ.ά.
Έκδοση: (1989)