PULSED LASER ATOM PROBE ANALYSIS OF TERNARY AND QUATERNARY III-V EPITAXIAL LAYERS

PULSED LASER ATOM PROBE ANALYSIS OF TERNARY AND QUATERNARY III-V EPITAXIAL LAYERS

Bibliografski detalji
Glavni autori:	Liddle, J, Norman, A, Cerezo, A, Grovenor, C
Format:	Journal article
Jezik:	English
Izdano:	1988

Slični predmeti

PULSED LASER ATOM PROBE ANALYSIS OF III-V COMPOUND SEMICONDUCTOR EPILAYERS
od: Mackenzie, R, i dr.
Izdano: (1990)

PULSED LASER ATOM PROBE ANALYSIS OF III-V COMPOUND SEMICONDUCTORS
od: Cerezo, A, i dr.
Izdano: (1986)

PULSED LASER ATOM PROBE ANALYSIS OF SEMICONDUCTOR-MATERIALS
od: Grovenor, C, i dr.
Izdano: (1987)

PULSED LASER ATOM PROBE ANALYSIS OF GAAS AND INAS
od: Cerezo, A, i dr.
Izdano: (1985)

PULSED LASER ATOM PROBE ANALYSIS OF SEMICONDUCTOR-MATERIALS
od: Cerezo, A, i dr.
Izdano: (1986)

ULTRAHIGH RESOLUTION CHARACTERIZATION OF COMPOUND SEMICONDUCTORS USING PULSED LASER ATOM PROBE TECHNIQUES
od: Mackenzie, R, i dr.
Izdano: (1991)

APPLICATION OF POSITION-SENSITIVE ATOM PROBE TO THE STUDY OF THE MICROCHEMISTRY AND MORPHOLOGY OF QUANTUM WELL INTERFACES
od: Liddle, J, i dr.
Izdano: (1989)

THE EFFECT OF LASER-PULSE SHAPE ON MASS RESOLUTION IN THE PULSED-LASER ATOM PROBE
od: Cerezo, A, i dr.
Izdano: (1987)

POSITION-SENSITIVE ATOM PROBE ANALYSIS OF MULTI-QUANTUM-WELL STRUCTURES
od: Liddle, J, i dr.
Izdano: (1989)

POSITION-SENSITIVE ATOM PROBE ANALYSIS OF MULTIPLE QUANTUM-WELL STRUCTURES
od: Cerezo, A, i dr.
Izdano: (1989)

POSITION-SENSITIVE ATOM PROBE ANALYSIS OF MULTIPLE QUANTUM-WELL STRUCTURES
od: Cerezo, A, i dr.
Izdano: (1989)

POSITION-SENSITIVE ATOM PROBE AND STEM ANALYSIS OF THE MICROCHEMISTRY OF GAINAS/INP QUANTUM WELLS
od: Liddle, J, i dr.
Izdano: (1989)

APPLICATION OF A POSITION-SENSITIVE ATOM PROBE TO THE ANALYSIS OF THE CHEMISTRY AND MORPHOLOGY OF MULTI-QUANTUM-WELL INTERFACES
od: Cerezo, A, i dr.
Izdano: (1989)

PULSED LASER ATOM PROBE CHARACTERIZATION OF SILICON-CARBIDE
od: Miller, M, i dr.
Izdano: (1989)

Accuracy of pulsed laser atom probe tomography for compound semiconductor analysis
od: Mueller, M, i dr.
Izdano: (2011)

Measurement of temperature rises in the femtosecond laser pulsed three-dimensional atom probe
od: Cerezo, A, i dr.
Izdano: (2006)

Measurement of temperature rises in the femtosecond laser pulsed three-dimensional atom probe
od: Cerezo, A, i dr.
Izdano: (2006)

Aspects of the performance of a femtosecond laser-pulsed 3-dimensional atom probe.
od: Cerezo, A, i dr.
Izdano: (2007)

Nanoscale characterization of compound semiconductors using laser-pulsed atom probe tomography
od: Muller, M, i dr.
Izdano: (2010)

Nanoscale characterization of compound semiconductors using laser-pulsed atom probe tomography
od: Müller, M, i dr.
Izdano: (2010)

Compositional nonuniformities in pulsed laser atom probe tomography analysis of compound semiconductors
od: Mueller, M, i dr.
Izdano: (2012)

Phase separation in thick InGaN layers - A quantitative, nanoscale study by pulsed laser atom probe tomography
od: Mueller, M, i dr.
Izdano: (2012)

COMPOSITION FLUCTUATIONS IN III-V SEMICONDUCTORS
od: Mackenzie, R, i dr.
Izdano: (1989)

MATERIALS ANALYSIS WITH A POSITION-SENSITIVE ATOM PROBE
od: Cerezo, A, i dr.
Izdano: (1989)

Influence of surface migration on the spatial resolution of pulsed laser atom probe tomography
od: Gault, B, i dr.
Izdano: (2010)

RECENT DEVELOPMENTS IN ATOM PROBE MICROANALYSIS OF MATERIALS WITH ULTRAFINE MICROSTRUCTURES
od: Grovenor, C, i dr.
Izdano: (1990)

RECENT DEVELOPMENTS IN ATOM PROBE MICROANALYSIS OF MATERIALS WITH ULTRAFINE MICROSTRUCTURES
od: Grovenor, C, i dr.
Izdano: (1990)

IMPROVEMENTS IN THE TRANSMISSION OF VOLTAGE EVAPORATION PULSES IN THE ATOM-PROBE
od: Sijbrandij, S, i dr.
Izdano: (1995)

RECENT DEVELOPMENTS IN THE STUDY OF SEMICONDUCTORS BY ATOM PROBE MICROANALYSIS.
od: Grovenor, C, i dr.
Izdano: (1985)

ULTRA-HIGH-RESOLUTION CHEMICAL-ANALYSIS BY FIELD-ION MICROSCOPY, ATOM PROBE AND POSITION-SENSITIVE ATOM-PROBE TECHNIQUES
od: Grovenor, C, i dr.
Izdano: (1992)

SURFACE-ANALYSIS WITH A POSITION-SENSITIVE ATOM PROBE
od: Cerezo, A, i dr.
Izdano: (1989)

FIELD-ION MICROSCOPY AND ATOM PROBE MICROANALYSIS OF SEMICONDUCTOR-MATERIALS
od: Grovenor, C, i dr.
Izdano: (1983)

3D atom probe study of gaseous adsorption on alloy catalyst surfaces III: Ternary alloys - NO on Pt-Rh-Ru and Pt-Rh-Ir
od: Bagot, P, i dr.
Izdano: (2008)

Atomic scale characterization of buried In(x)Ga(1-x)As quantum dots using pulsed laser atom probe tomography
od: Mueller, M, i dr.
Izdano: (2008)

Constructing oxide interfaces and heterostructures by atomic layer-by-layer laser molecular beam epitaxy
od: Qingyu Lei, i dr.
Izdano: (2017-02-01)

Impact of laser pulsing on the reconstruction in an atom probe tomography.
od: Gault, B, i dr.
Izdano: (2010)

Interfacial chemistry in an InAs/GaSb superlattice studied by pulsed laser atom probe tomography
od: Mueller, M, i dr.
Izdano: (2012)

ATOM PROBE ANALYSIS OF A CERAMIC OXIDE SUPERCONDUCTOR
od: Cerezo, A, i dr.
Izdano: (1988)

ATOM PROBE STUDIES OF THE COMPOSITION OF LOW-TEMPERATURE OXIDES ON (100) SILICON AND GALLIUM-ARSENIDE SURFACES
od: Grovenor, C, i dr.
Izdano: (1989)

Atom probe tomography characterisation of a laser diode structure grown by molecular beam epitaxy
od: Bennett, SE, i dr.
Izdano: (2012)