Studies of boundaries and interfaces on the atomic scale by atom probe FIM

Studies of boundaries and interfaces on the atomic scale by atom probe FIM

This paper describes recent developments in the experimental methods of atom probe field ion microscopy, and in particular the means for the three-dimensional reconstruction of the atomic chemistry of solids. A selection of applications is presented, involving the study of grain boundary and interfa...

Descrizione completa

Dettagli Bibliografici
Autori principali:	Smith, G, Cerezo, A, Godfrey, T, Seto, K, Warren, P
Natura:	Conference item
Pubblicazione:	1998

Documenti analoghi

A FIM ATOM PROBE STUDY OF VANADIUM OXIDATION
di: Setna, R, et al.
Pubblicazione: (1989)

THE FIM100 - PERFORMANCE OF A COMMERCIAL ATOM PROBE SYSTEM
di: Cerezo, A, et al.
Pubblicazione: (1984)

Automobile exhaust catalysis at the atomic scale: atom-probe investigations on platinum alloys
di: Bagot, P, et al.
Pubblicazione: (2007)

Three-dimensional atomic scale analysis of interfaces
di: Cerezo, A, et al.
Pubblicazione: (1999)

Performance of an energy-compensated three-dimensional atom probe
di: Cerezo, A, et al.
Pubblicazione: (1998)

FIM AND ATOM-PROBE STUDIES OF DEFECTS IN DOPED TUNGSTEN LAMP WIRES
di: Beaven, P, et al.
Pubblicazione: (1979)

Applications of a high-resolution three dimensional atom probe
di: Smith, G, et al.
Pubblicazione: (1997)

Progress in the atomic-scale analysis of materials with the three-dimensional atom probe
di: Cerezo, A, et al.
Pubblicazione: (2001)

A FIM/ATOM-PROBE STUDY OF PHASE-TRANSFORMATIONS IN MOLYBDENUM STEELS
di: Stark, I, et al.
Pubblicazione: (1987)

PROGRESS WITH FIM AND ATOM-PROBE INVESTIGATIONS OF NICKEL-BASED SUPER-ALLOYS
di: Delargy, K, et al.
Pubblicazione: (1979)

LATERAL AND DEPTH SCALE CALIBRATION OF THE POSITION-SENSITIVE ATOM-PROBE
di: Hyde, J, et al.
Pubblicazione: (1994)

AN FIM-ATOM PROBE AND TEM STUDY OF ALNICO PERMANENT MAGNETIC MATERIAL
di: Cowley, S, et al.
Pubblicazione: (1986)

Grain boundary segregation in boron added interstitial free steels studied by 3-dimensional atom probe
di: Seto, K, et al.
Pubblicazione: (1999)

AN ELECTRONIC AND COMPUTER-SYSTEM FOR AN AUTOMATED ATOM PROBE
di: Cerezo, A, et al.
Pubblicazione: (1984)

Improvements in the mass resolution of the three-dimensional atom probe
di: Sijbrandij, S, et al.
Pubblicazione: (1996)

IMPROVEMENTS IN 3-DIMENSIONAL ATOM-PROBE DESIGN
di: Cerezo, A, et al.
Pubblicazione: (1994)

DEVELOPMENT AND INITIAL APPLICATIONS OF A POSITION-SENSITIVE ATOM PROBE
di: Cerezo, A, et al.
Pubblicazione: (1988)

APPLICATION OF A POSITION-SENSITIVE DETECTOR TO ATOM PROBE MICROANALYSIS
di: Cerezo, A, et al.
Pubblicazione: (1988)

An atom probe study of the distribution of rhenium in a nickel-based superalloy
di: Warren, P, et al.
Pubblicazione: (1998)

Some recent advances in three dimensional atomic scale microanalysis with the atom probe (invited)
di: Cerezo, A, et al.
Pubblicazione: (1994)

SURFACE-ANALYSIS WITH A POSITION-SENSITIVE ATOM PROBE
di: Cerezo, A, et al.
Pubblicazione: (1989)

ATOM PROBE ANALYSIS AND MODELING OF INTERFACES IN MAGNETIC MULTILAYERS
di: Petfordlong, A, et al.
Pubblicazione: (1992)

NEW DIMENSIONS IN ATOM-PROBE ANALYSIS
di: Cerezo, A, et al.
Pubblicazione: (1992)

Design of a scanning atom probe with improved mass resolution
di: Cerezo, A, et al.
Pubblicazione: (2000)

An atom probe study of fine scale structure in AlMgSi(Cu) alloys
di: Vaumousse, D, et al.
Pubblicazione: (2002)

RECENT DEVELOPMENTS IN POSITION-SENSITIVE ATOM-PROBE MICROANALYSIS
di: Smith, G, et al.
Pubblicazione: (1994)

THE POSITION-SENSITIVE ATOM PROBE - RECONSTRUCTION OF THE ATOMIC CHEMISTRY OF SOLIDS IN 3-DIMENSIONS (SUMMARY)
di: Cerezo, A, et al.
Pubblicazione: (1991)

3-D atom probe studies of some nanostructured materials
di: Warren, P, et al.
Pubblicazione: (2000)

Atomic scale study of precipitate/matrix interfaces in a metallic alloy
di: Rozdilsky, I, et al.
Pubblicazione: (1998)

Reflections on the analysis of interfaces and grain boundaries by atom probe tomography
di: Jenkins, BM, et al.
Pubblicazione: (2020)

RECENT DEVELOPMENTS IN THE STUDY OF SEMICONDUCTORS BY ATOM PROBE MICROANALYSIS.
di: Grovenor, C, et al.
Pubblicazione: (1985)

Materials applications of an advanced 3-dimensional atom probe
di: Cerezo, A, et al.
Pubblicazione: (1996)

STATISTICAL-ANALYSIS OF ATOM PROBE DATA
di: Hetherington, M, et al.
Pubblicazione: (1986)

Atomic scale characterization of buried In(x)Ga(1-x)As quantum dots using pulsed laser atom probe tomography
di: Mueller, M, et al.
Pubblicazione: (2008)

PERFORMANCE AND APPLICATIONS OF AN IMAGING ATOM-PROBE
di: Miller, M, et al.
Pubblicazione: (1979)

IMPROVEMENTS IN THE TRANSMISSION OF VOLTAGE EVAPORATION PULSES IN THE ATOM-PROBE
di: Sijbrandij, S, et al.
Pubblicazione: (1995)

Three-dimensional atom probe studies of metallic multilayers
di: Larson, D, et al.
Pubblicazione: (1999)

Optimisation of a scanning atom probe with improved mass resolution using post deceleration.
di: Grennan-Heaven, N, et al.
Pubblicazione: (2007)

ATOMIC RESOLUTION OF SURFACES IN THE ATOM PROBE
di: Smith, G
Pubblicazione: (1981)

MATERIALS ANALYSIS WITH A POSITION-SENSITIVE ATOM PROBE
di: Cerezo, A, et al.
Pubblicazione: (1989)