Studies of boundaries and interfaces on the atomic scale by atom probe FIM

Studies of boundaries and interfaces on the atomic scale by atom probe FIM

This paper describes recent developments in the experimental methods of atom probe field ion microscopy, and in particular the means for the three-dimensional reconstruction of the atomic chemistry of solids. A selection of applications is presented, involving the study of grain boundary and interfa...

書誌詳細
主要な著者:	Smith, G, Cerezo, A, Godfrey, T, Seto, K, Warren, P
フォーマット:	Conference item
出版事項:	1998

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