APPLICATION OF POSITION-SENSITIVE ATOM PROBE TO THE STUDY OF THE MICROCHEMISTRY AND MORPHOLOGY OF QUANTUM WELL INTERFACES
The morphology and microchemistry of interfaces in GaInAs/InP quantum well structures have been studied with extremely high resolution by the new technique of position sensitive atom probe microanalysis. This letter presents some preliminary results demonstrating the power of the technique in determ...
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| Format: | Journal article |
| Language: | English |
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1989
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| _version_ | 1797078030244380672 |
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| author | Liddle, J Norman, A Cerezo, A Grovenor, C |
| author_facet | Liddle, J Norman, A Cerezo, A Grovenor, C |
| author_sort | Liddle, J |
| collection | OXFORD |
| description | The morphology and microchemistry of interfaces in GaInAs/InP quantum well structures have been studied with extremely high resolution by the new technique of position sensitive atom probe microanalysis. This letter presents some preliminary results demonstrating the power of the technique in determining the structure and chemistry of individual interfaces in multilayer epitaxial semiconductor samples. |
| first_indexed | 2024-03-07T00:26:36Z |
| format | Journal article |
| id | oxford-uuid:7e59d037-d3a0-4f49-b55e-01ae6cbe29f9 |
| institution | University of Oxford |
| language | English |
| last_indexed | 2024-03-07T00:26:36Z |
| publishDate | 1989 |
| record_format | dspace |
| spelling | oxford-uuid:7e59d037-d3a0-4f49-b55e-01ae6cbe29f92022-03-26T21:09:35ZAPPLICATION OF POSITION-SENSITIVE ATOM PROBE TO THE STUDY OF THE MICROCHEMISTRY AND MORPHOLOGY OF QUANTUM WELL INTERFACESJournal articlehttp://purl.org/coar/resource_type/c_dcae04bcuuid:7e59d037-d3a0-4f49-b55e-01ae6cbe29f9EnglishSymplectic Elements at Oxford1989Liddle, JNorman, ACerezo, AGrovenor, CThe morphology and microchemistry of interfaces in GaInAs/InP quantum well structures have been studied with extremely high resolution by the new technique of position sensitive atom probe microanalysis. This letter presents some preliminary results demonstrating the power of the technique in determining the structure and chemistry of individual interfaces in multilayer epitaxial semiconductor samples. |
| spellingShingle | Liddle, J Norman, A Cerezo, A Grovenor, C APPLICATION OF POSITION-SENSITIVE ATOM PROBE TO THE STUDY OF THE MICROCHEMISTRY AND MORPHOLOGY OF QUANTUM WELL INTERFACES |
| title | APPLICATION OF POSITION-SENSITIVE ATOM PROBE TO THE STUDY OF THE MICROCHEMISTRY AND MORPHOLOGY OF QUANTUM WELL INTERFACES |
| title_full | APPLICATION OF POSITION-SENSITIVE ATOM PROBE TO THE STUDY OF THE MICROCHEMISTRY AND MORPHOLOGY OF QUANTUM WELL INTERFACES |
| title_fullStr | APPLICATION OF POSITION-SENSITIVE ATOM PROBE TO THE STUDY OF THE MICROCHEMISTRY AND MORPHOLOGY OF QUANTUM WELL INTERFACES |
| title_full_unstemmed | APPLICATION OF POSITION-SENSITIVE ATOM PROBE TO THE STUDY OF THE MICROCHEMISTRY AND MORPHOLOGY OF QUANTUM WELL INTERFACES |
| title_short | APPLICATION OF POSITION-SENSITIVE ATOM PROBE TO THE STUDY OF THE MICROCHEMISTRY AND MORPHOLOGY OF QUANTUM WELL INTERFACES |
| title_sort | application of position sensitive atom probe to the study of the microchemistry and morphology of quantum well interfaces |
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