$Applications of multivariate statistical methods and simulation libraries to analysis of electron backscatter diffraction and transmission Kikuchi diffraction datasets$

Applications of multivariate statistical methods and simulation libraries to analysis of electron backscatter diffraction and transmission Kikuchi diffraction datasets

Multivariate statistical methods are widely used throughout the sciences, including microscopy, however, their utilisation for analysis of electron backscatter diffraction (EBSD) data has not been adequately explored. The basic aim of most EBSD analysis is to segment the spatial domain to reveal and...

Πλήρης περιγραφή

Λεπτομέρειες βιβλιογραφικής εγγραφής
Κύριοι συγγραφείς:	Wilkinson, A, Collins, D, Zayachuk, Y, Korla, R, Vilalta-Clemente, A
Μορφή:	Journal article
Έκδοση:	Elsevier 2018

Παρόμοια τεκμήρια

Analysis of dislocation densities using high resolution electron backscatter diffraction
ανά: Vilalta-Clemente, A, κ.ά.
Έκδοση: (2015)

Improving Transmission Kikuchi Diffraction workflows
ανά: Coleman Mark, κ.ά.
Έκδοση: (2024-01-01)

Characterization of elastic strain field and geometrically necessary dislocation distribution in stress corrosion cracking of 316 stainless steels by transmission Kikuchi diffraction
ανά: Wilkinson, A, κ.ά.
Έκδοση: (2015)

High-resolution electron backscatter diffraction in III-nitride semiconductors
ανά: Vilalta-Clemente, A, κ.ά.
Έκδοση: (2015)

Strain mapping using electron backscatter diffraction
ανά: Wilkinson, A, κ.ά.
Έκδοση: (2009)

Direct detection of electron backscatter diffraction patterns.
ανά: Wilkinson, A, κ.ά.
Έκδοση: (2013)

Spatial Resolutions of On-Axis and Off-Axis Transmission Kikuchi Diffraction Methods
ανά: Yitian Shen, κ.ά.
Έκδοση: (2019-10-01)

Effect of sample thinning on strains and lattice rotations measured from Transmission Kikuchi diffraction in the SEM
ανά: Karamched, PS, κ.ά.
Έκδοση: (2021)

Quantitative imaging of anti-phase domains by polarity sensitive orientation mapping using electron backscatter diffraction
ανά: Naresh-Kumar, G, κ.ά.
Έκδοση: (2017)

Quantitative imaging of anti-phase domains by polarity sensitive orientation mapping using electron backscatter diffraction
ανά: G. Naresh-Kumar, κ.ά.
Έκδοση: (2017-09-01)

Electron backscatter diffraction in the silicon nanowires
ανά: K.K. Dikhanbayev, κ.ά.
Έκδοση: (2016-10-01)

Measurement of plastic strain of polycrystalline material by electron backscatter diffraction
ανά: Kamaya, M, κ.ά.
Έκδοση: (2005)

Electron backscatter diffraction in materials characterization
ανά: Dejan Stojakovic
Έκδοση: (2012-03-01)

High resolution mapping of strains and rotations using electron backscatter diffraction
ανά: Wilkinson, A, κ.ά.
Έκδοση: (2013)

High resolution mapping of strains and rotations using electron backscatter diffraction
ανά: Wilkinson, A, κ.ά.
Έκδοση: (2006)

Elastic strain tensor measurement using electron backscatter diffraction in the SEM.
ανά: Dingley, D, κ.ά.
Έκδοση: (2010)

Methods for determining elastic strains from electron backscatter diffraction and electron channelling patterns
ανά: Wilkinson, A
Έκδοση: (1997)

Tetragonality of Fe-C martensite – a pattern matching electron backscatter diffraction analysis compared to X-ray diffraction
ανά: Tanaka, T, κ.ά.
Έκδοση: (2020)

Ambiguity of quasicrystalline and cubic approximant symmetry in Kikuchi diffraction patterns
ανά: Grzegorz Cios, κ.ά.
Έκδοση: (2024-12-01)

Quantification of plastic strain of stainless steel and nickel alloy by electron backscatter diffraction
ανά: Kamaya, M, κ.ά.
Έκδοση: (2006)

The effect of pattern overlap on the accuracy of high resolution electron backscatter diffraction measurements.
ανά: Tong, V, κ.ά.
Έκδοση: (2015)

Mapping the full lattice strain tensor of a single dislocation by high angular resolution transmission Kikuchi diffraction (HR-TKD)
ανά: Yu, H, κ.ά.
Έκδοση: (2019)

Rapid electron backscatter diffraction mapping: painting by numbers
ανά: Tong, V, κ.ά.
Έκδοση: (2018)

Measurement of residual elastic strain and lattice rotations with high resolution electron backscatter diffraction.
ανά: Britton, T, κ.ά.
Έκδοση: (2011)

High-resolution electron backscatter diffraction: an emerging tool for studying local deformation
ανά: Wilkinson, A, κ.ά.
Έκδοση: (2010)

Emitter-site specificity of hard x-ray photoelectron Kikuchi-diffraction
ανά: O Fedchenko, κ.ά.
Έκδοση: (2020-01-01)

Application of Electron Backscatter Diffraction to Calcite-Twinning Paleopiezometry
ανά: Ernest Rutter, κ.ά.
Έκδοση: (2022-05-01)

Microstrain distribution mapping on CuInSe2 thin films by means of electron backscatter diffraction, X-ray diffraction, and Raman microspectroscopy.
ανά: Schäfer, N, κ.ά.
Έκδοση: (2016)

Effects of multiple elastic and inelastic scattering on energy-resolved contrast in Kikuchi diffraction
ανά: M Vos, κ.ά.
Έκδοση: (2019-01-01)

Characterization of nitride thin films by electron backscatter diffraction and electron channeling contrast imaging
ανά: Trager-Cowan, C, κ.ά.
Έκδοση: (2006)

High resolution measurements of strain and tilt distributions in SiGe mesas using electron backscatter diffraction
ανά: Wilkinson, A
Έκδοση: (2006)

High resolution measurements of strain and tilt distributions in SiGe mesas using electron backscatter diffraction
ανά: Wilkinson, A
Έκδοση: (2006)

Characterisation of nitride thin films by electron backscatter diffraction and electron channelling contrast imaging
ανά: Trager-Cowan, C, κ.ά.
Έκδοση: (2006)

High resolution electron backscatter diffraction measurements of elastic strain variations in the presence of larger lattice rotations.
ανά: Britton, T, κ.ά.
Έκδοση: (2012)

An iterative method for reference pattern selection in high-resolution electron backscatter diffraction (HR-EBSD)
ανά: Koko, A, κ.ά.
Έκδοση: (2023)

Cross-correlation based high resolution electron backscatter diffraction and electron channelling contrast imaging for strain mapping and dislocation distributions in InAlN thin films
ανά: Wilkinson, A, κ.ά.
Έκδοση: (2016)

Measurement of fatigue crack plastic zones in fine grained materials using electron backscattered diffraction
ανά: Tucker, A, κ.ά.
Έκδοση: (2000)

Measurement of fatigue crack plastic zones in fine grained materials using electron backscattered diffraction
ανά: Tucker, A, κ.ά.
Έκδοση: (2000)

Assessing the precision of strain measurements using electron backscatter diffraction--part 1: detector assessment.
ανά: Britton, T, κ.ά.
Έκδοση: (2013)

Assessing the precision of strain measurements using electron backscatter diffraction--part 2: experimental demonstration.
ανά: Britton, T, κ.ά.
Έκδοση: (2013)