$Applications of multivariate statistical methods and simulation libraries to analysis of electron backscatter diffraction and transmission Kikuchi diffraction datasets$

Applications of multivariate statistical methods and simulation libraries to analysis of electron backscatter diffraction and transmission Kikuchi diffraction datasets

Multivariate statistical methods are widely used throughout the sciences, including microscopy, however, their utilisation for analysis of electron backscatter diffraction (EBSD) data has not been adequately explored. The basic aim of most EBSD analysis is to segment the spatial domain to reveal and...

Бүрэн тодорхойлолт

Номзүйн дэлгэрэнгүй
Үндсэн зохиолчид:	Wilkinson, A, Collins, D, Zayachuk, Y, Korla, R, Vilalta-Clemente, A
Формат:	Journal article
Хэвлэсэн:	Elsevier 2018

Ижил төстэй зүйлс

Analysis of dislocation densities using high resolution electron backscatter diffraction
-н: Vilalta-Clemente, A, зэрэг
Хэвлэсэн: (2015)

Improving Transmission Kikuchi Diffraction workflows
-н: Coleman Mark, зэрэг
Хэвлэсэн: (2024-01-01)

Characterization of elastic strain field and geometrically necessary dislocation distribution in stress corrosion cracking of 316 stainless steels by transmission Kikuchi diffraction
-н: Wilkinson, A, зэрэг
Хэвлэсэн: (2015)

High-resolution electron backscatter diffraction in III-nitride semiconductors
-н: Vilalta-Clemente, A, зэрэг
Хэвлэсэн: (2015)

Strain mapping using electron backscatter diffraction
-н: Wilkinson, A, зэрэг
Хэвлэсэн: (2009)

Direct detection of electron backscatter diffraction patterns.
-н: Wilkinson, A, зэрэг
Хэвлэсэн: (2013)

Spatial Resolutions of On-Axis and Off-Axis Transmission Kikuchi Diffraction Methods
-н: Yitian Shen, зэрэг
Хэвлэсэн: (2019-10-01)

Effect of sample thinning on strains and lattice rotations measured from Transmission Kikuchi diffraction in the SEM
-н: Karamched, PS, зэрэг
Хэвлэсэн: (2021)

Quantitative imaging of anti-phase domains by polarity sensitive orientation mapping using electron backscatter diffraction
-н: Naresh-Kumar, G, зэрэг
Хэвлэсэн: (2017)

Quantitative imaging of anti-phase domains by polarity sensitive orientation mapping using electron backscatter diffraction
-н: G. Naresh-Kumar, зэрэг
Хэвлэсэн: (2017-09-01)

Electron backscatter diffraction in the silicon nanowires
-н: K.K. Dikhanbayev, зэрэг
Хэвлэсэн: (2016-10-01)

Measurement of plastic strain of polycrystalline material by electron backscatter diffraction
-н: Kamaya, M, зэрэг
Хэвлэсэн: (2005)

Electron backscatter diffraction in materials characterization
-н: Dejan Stojakovic
Хэвлэсэн: (2012-03-01)

High resolution mapping of strains and rotations using electron backscatter diffraction
-н: Wilkinson, A, зэрэг
Хэвлэсэн: (2013)

High resolution mapping of strains and rotations using electron backscatter diffraction
-н: Wilkinson, A, зэрэг
Хэвлэсэн: (2006)

Elastic strain tensor measurement using electron backscatter diffraction in the SEM.
-н: Dingley, D, зэрэг
Хэвлэсэн: (2010)

Methods for determining elastic strains from electron backscatter diffraction and electron channelling patterns
-н: Wilkinson, A
Хэвлэсэн: (1997)

Tetragonality of Fe-C martensite – a pattern matching electron backscatter diffraction analysis compared to X-ray diffraction
-н: Tanaka, T, зэрэг
Хэвлэсэн: (2020)

Ambiguity of quasicrystalline and cubic approximant symmetry in Kikuchi diffraction patterns
-н: Grzegorz Cios, зэрэг
Хэвлэсэн: (2024-12-01)

Quantification of plastic strain of stainless steel and nickel alloy by electron backscatter diffraction
-н: Kamaya, M, зэрэг
Хэвлэсэн: (2006)

The effect of pattern overlap on the accuracy of high resolution electron backscatter diffraction measurements.
-н: Tong, V, зэрэг
Хэвлэсэн: (2015)

Mapping the full lattice strain tensor of a single dislocation by high angular resolution transmission Kikuchi diffraction (HR-TKD)
-н: Yu, H, зэрэг
Хэвлэсэн: (2019)

Rapid electron backscatter diffraction mapping: painting by numbers
-н: Tong, V, зэрэг
Хэвлэсэн: (2018)

Measurement of residual elastic strain and lattice rotations with high resolution electron backscatter diffraction.
-н: Britton, T, зэрэг
Хэвлэсэн: (2011)

High-resolution electron backscatter diffraction: an emerging tool for studying local deformation
-н: Wilkinson, A, зэрэг
Хэвлэсэн: (2010)

Emitter-site specificity of hard x-ray photoelectron Kikuchi-diffraction
-н: O Fedchenko, зэрэг
Хэвлэсэн: (2020-01-01)

Application of Electron Backscatter Diffraction to Calcite-Twinning Paleopiezometry
-н: Ernest Rutter, зэрэг
Хэвлэсэн: (2022-05-01)

Microstrain distribution mapping on CuInSe2 thin films by means of electron backscatter diffraction, X-ray diffraction, and Raman microspectroscopy.
-н: Schäfer, N, зэрэг
Хэвлэсэн: (2016)

Effects of multiple elastic and inelastic scattering on energy-resolved contrast in Kikuchi diffraction
-н: M Vos, зэрэг
Хэвлэсэн: (2019-01-01)

Characterization of nitride thin films by electron backscatter diffraction and electron channeling contrast imaging
-н: Trager-Cowan, C, зэрэг
Хэвлэсэн: (2006)

High resolution measurements of strain and tilt distributions in SiGe mesas using electron backscatter diffraction
-н: Wilkinson, A
Хэвлэсэн: (2006)

High resolution measurements of strain and tilt distributions in SiGe mesas using electron backscatter diffraction
-н: Wilkinson, A
Хэвлэсэн: (2006)

Characterisation of nitride thin films by electron backscatter diffraction and electron channelling contrast imaging
-н: Trager-Cowan, C, зэрэг
Хэвлэсэн: (2006)

High resolution electron backscatter diffraction measurements of elastic strain variations in the presence of larger lattice rotations.
-н: Britton, T, зэрэг
Хэвлэсэн: (2012)

An iterative method for reference pattern selection in high-resolution electron backscatter diffraction (HR-EBSD)
-н: Koko, A, зэрэг
Хэвлэсэн: (2023)

Cross-correlation based high resolution electron backscatter diffraction and electron channelling contrast imaging for strain mapping and dislocation distributions in InAlN thin films
-н: Wilkinson, A, зэрэг
Хэвлэсэн: (2016)

Measurement of fatigue crack plastic zones in fine grained materials using electron backscattered diffraction
-н: Tucker, A, зэрэг
Хэвлэсэн: (2000)

Measurement of fatigue crack plastic zones in fine grained materials using electron backscattered diffraction
-н: Tucker, A, зэрэг
Хэвлэсэн: (2000)

Assessing the precision of strain measurements using electron backscatter diffraction--part 1: detector assessment.
-н: Britton, T, зэрэг
Хэвлэсэн: (2013)

Assessing the precision of strain measurements using electron backscatter diffraction--part 2: experimental demonstration.
-н: Britton, T, зэрэг
Хэвлэсэн: (2013)