Neutron reflection from hexadecyltrimethylammonium bromide adsorbed on smooth and rough silicon surfaces
Neutron reflection has been used to investigate the structure of hexadecyltrimethylammonium bromide (C16TAB) layers adsorbed at the silicon/silicon oxide/aqueous interface. Separate isotopic labeling of groupe of four methylene groups at a time made it possible to determine the structure of the laye...
Príomhchruthaitheoirí: | , , , |
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Formáid: | Journal article |
Foilsithe / Cruthaithe: |
1996
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