Force-induced rupture of a DNA duplex: from fundamentals to force sensors
The rupture of double-stranded DNA under stress is a key process in biophysics and nanotechnology. In this article, we consider the shear-induced rupture of short DNA duplexes, a system that has been given new importance by recently designed force sensors and nanotechnological devices. We argue that...
Main Authors: | Mosayebi, M, Louis, AA, Doye, JPK, Ouldridge, TE |
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פורמט: | Journal article |
שפה: | English |
יצא לאור: |
American Chemical Society
2015
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