SPUTTERING OF A CU SOLID BY SICL4 MOLECULES

We present a theoretical investigation on the sputtering of a Cu solid by SiCl//4 molecules. The classical trajectory method is used to calculate Cu atom sputtering yields, degrees of anisotropy, kinetic energy distributions and angular distributions for collision energies up to 1000 eV. The only pr...

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Egile Nagusiak: Park, S, Stansfield, R, Clary, D
Formatua: Journal article
Hizkuntza:English
Argitaratua: 1987
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author Park, S
Stansfield, R
Clary, D
author_facet Park, S
Stansfield, R
Clary, D
author_sort Park, S
collection OXFORD
description We present a theoretical investigation on the sputtering of a Cu solid by SiCl//4 molecules. The classical trajectory method is used to calculate Cu atom sputtering yields, degrees of anisotropy, kinetic energy distributions and angular distributions for collision energies up to 1000 eV. The only products of the sputtering process are Cu atoms. However, CuCl molecules do form on the surface. Results for Ar** plus ion sputtering of the Cu solid are also reported for comparison with those for SiCl//4. It is found that the etching yield for the SiCl//4 molecules at energy E is close to five times that for Ar** plus at energy E/5. This is because the SiCl//4 molecule dissociates on impact to give five individual atoms.
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spelling oxford-uuid:842cb591-8e34-4e8c-b634-1e2a763b6bda2022-03-26T21:49:27ZSPUTTERING OF A CU SOLID BY SICL4 MOLECULESJournal articlehttp://purl.org/coar/resource_type/c_dcae04bcuuid:842cb591-8e34-4e8c-b634-1e2a763b6bdaEnglishSymplectic Elements at Oxford1987Park, SStansfield, RClary, DWe present a theoretical investigation on the sputtering of a Cu solid by SiCl//4 molecules. The classical trajectory method is used to calculate Cu atom sputtering yields, degrees of anisotropy, kinetic energy distributions and angular distributions for collision energies up to 1000 eV. The only products of the sputtering process are Cu atoms. However, CuCl molecules do form on the surface. Results for Ar** plus ion sputtering of the Cu solid are also reported for comparison with those for SiCl//4. It is found that the etching yield for the SiCl//4 molecules at energy E is close to five times that for Ar** plus at energy E/5. This is because the SiCl//4 molecule dissociates on impact to give five individual atoms.
spellingShingle Park, S
Stansfield, R
Clary, D
SPUTTERING OF A CU SOLID BY SICL4 MOLECULES
title SPUTTERING OF A CU SOLID BY SICL4 MOLECULES
title_full SPUTTERING OF A CU SOLID BY SICL4 MOLECULES
title_fullStr SPUTTERING OF A CU SOLID BY SICL4 MOLECULES
title_full_unstemmed SPUTTERING OF A CU SOLID BY SICL4 MOLECULES
title_short SPUTTERING OF A CU SOLID BY SICL4 MOLECULES
title_sort sputtering of a cu solid by sicl4 molecules
work_keys_str_mv AT parks sputteringofacusolidbysicl4molecules
AT stansfieldr sputteringofacusolidbysicl4molecules
AT claryd sputteringofacusolidbysicl4molecules