Two-dimensional modelling of electron flow through a poorly conducting layer

Motivated by contact resistance on the front side of a crystalline silicon solar cell, we formulate and analyse a two-dimensional mathematical model for electron flow across a poorly conducting (glass) layer situated between silver electrodes, based on the drift-diffusion (Poisson-Nernst-Planck) equ...

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Main Authors: Black, J, Breward, C, Howell, P
Format: Journal article
Published: Society for Industrial and Applied Mathematics 2015
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author Black, J
Breward, C
Howell, P
author_facet Black, J
Breward, C
Howell, P
author_sort Black, J
collection OXFORD
description Motivated by contact resistance on the front side of a crystalline silicon solar cell, we formulate and analyse a two-dimensional mathematical model for electron flow across a poorly conducting (glass) layer situated between silver electrodes, based on the drift-diffusion (Poisson-Nernst-Planck) equations. We devise and validate a novel spectral method to solve this model numerically. We find that the current short-circuits through thin glass layer regions. This enables us to determine asymptotic expressions for the average current density for two different canonical glass layer profiles.
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spelling oxford-uuid:86ab1477-aff9-4304-bc97-d2d17fa984422022-03-26T22:05:28ZTwo-dimensional modelling of electron flow through a poorly conducting layerJournal articlehttp://purl.org/coar/resource_type/c_dcae04bcuuid:86ab1477-aff9-4304-bc97-d2d17fa98442Symplectic Elements at OxfordSociety for Industrial and Applied Mathematics2015Black, JBreward, CHowell, PMotivated by contact resistance on the front side of a crystalline silicon solar cell, we formulate and analyse a two-dimensional mathematical model for electron flow across a poorly conducting (glass) layer situated between silver electrodes, based on the drift-diffusion (Poisson-Nernst-Planck) equations. We devise and validate a novel spectral method to solve this model numerically. We find that the current short-circuits through thin glass layer regions. This enables us to determine asymptotic expressions for the average current density for two different canonical glass layer profiles.
spellingShingle Black, J
Breward, C
Howell, P
Two-dimensional modelling of electron flow through a poorly conducting layer
title Two-dimensional modelling of electron flow through a poorly conducting layer
title_full Two-dimensional modelling of electron flow through a poorly conducting layer
title_fullStr Two-dimensional modelling of electron flow through a poorly conducting layer
title_full_unstemmed Two-dimensional modelling of electron flow through a poorly conducting layer
title_short Two-dimensional modelling of electron flow through a poorly conducting layer
title_sort two dimensional modelling of electron flow through a poorly conducting layer
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