Smart and quantitative near-infrared point-diffraction interferometer based on the self-referencing wavefront sensor

This paper describes the development of a novel infrared point-diffraction interferometer (IPDI), which can be readily applied to real-time quantitative phase measurement. We generate reference wave with the help of Michelson-like unit combined with a low-pass spatial filter, and extract the phase i...

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Main Authors: Yang, P, Hippler, S, Deen, C, Brandner, W, Kendrew, S, Miao, J, Zhang, Y, Zhu, J
Format: Journal article
Language:English
Published: 2013
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author Yang, P
Hippler, S
Deen, C
Brandner, W
Kendrew, S
Miao, J
Zhang, Y
Zhu, J
author_facet Yang, P
Hippler, S
Deen, C
Brandner, W
Kendrew, S
Miao, J
Zhang, Y
Zhu, J
author_sort Yang, P
collection OXFORD
description This paper describes the development of a novel infrared point-diffraction interferometer (IPDI), which can be readily applied to real-time quantitative phase measurement. We generate reference wave with the help of Michelson-like unit combined with a low-pass spatial filter, and extract the phase information using windowed Fourier transform algorithm from single off-axis fringes. The arrangement of the proposed setup offers a quasi-common-path geometry, which could significantly minimize the systematic errors. The proposed method of IPDI is effective and sufficient for the dynamic process measurement of small deformation with higher spatial resolution compared with the conventional off-axis scheme. The feasibility of the proposed setup is demonstrated, followed by methods of reconstruction and system calibration. The nanoscale repeatability is achieved in our experiment.
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spelling oxford-uuid:889715a5-6143-46d0-b469-c47b7fa4cb9a2022-03-26T22:18:23ZSmart and quantitative near-infrared point-diffraction interferometer based on the self-referencing wavefront sensorJournal articlehttp://purl.org/coar/resource_type/c_dcae04bcuuid:889715a5-6143-46d0-b469-c47b7fa4cb9aEnglishSymplectic Elements at Oxford2013Yang, PHippler, SDeen, CBrandner, WKendrew, SMiao, JZhang, YZhu, JThis paper describes the development of a novel infrared point-diffraction interferometer (IPDI), which can be readily applied to real-time quantitative phase measurement. We generate reference wave with the help of Michelson-like unit combined with a low-pass spatial filter, and extract the phase information using windowed Fourier transform algorithm from single off-axis fringes. The arrangement of the proposed setup offers a quasi-common-path geometry, which could significantly minimize the systematic errors. The proposed method of IPDI is effective and sufficient for the dynamic process measurement of small deformation with higher spatial resolution compared with the conventional off-axis scheme. The feasibility of the proposed setup is demonstrated, followed by methods of reconstruction and system calibration. The nanoscale repeatability is achieved in our experiment.
spellingShingle Yang, P
Hippler, S
Deen, C
Brandner, W
Kendrew, S
Miao, J
Zhang, Y
Zhu, J
Smart and quantitative near-infrared point-diffraction interferometer based on the self-referencing wavefront sensor
title Smart and quantitative near-infrared point-diffraction interferometer based on the self-referencing wavefront sensor
title_full Smart and quantitative near-infrared point-diffraction interferometer based on the self-referencing wavefront sensor
title_fullStr Smart and quantitative near-infrared point-diffraction interferometer based on the self-referencing wavefront sensor
title_full_unstemmed Smart and quantitative near-infrared point-diffraction interferometer based on the self-referencing wavefront sensor
title_short Smart and quantitative near-infrared point-diffraction interferometer based on the self-referencing wavefront sensor
title_sort smart and quantitative near infrared point diffraction interferometer based on the self referencing wavefront sensor
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