León, J., & Collahua, Y. (2015). Technical note 33: The reliability and validity of achievement tests in the second Young Lives school survey in Ethiopia. Young Lives.
芝加哥风格引文León, J., 与 Y. Collahua. Technical Note 33: The Reliability and Validity of Achievement Tests in the Second Young Lives School Survey in Ethiopia. Young Lives, 2015.
MLA引文León, J., 与 Y. Collahua. Technical Note 33: The Reliability and Validity of Achievement Tests in the Second Young Lives School Survey in Ethiopia. Young Lives, 2015.
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