An investigation into experimental in situ scanning electron microscope (SEM) imaging at high temperature

This paper presents an investigation into high temperature imaging of metals through the use of a novel heat stage for in situ Scanning Electron Microscopy (SEM). The results obtained demonstrate the benefits and challenges of SEM imaging at elevated temperatures of up to 850 °C using Secondary Elec...

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Egile Nagusiak: Heard, R, Huber, JE, Siviour, C, Edwards, G, Williamson-Brown, E, Dragnevski, K
Formatua: Journal article
Hizkuntza:English
Argitaratua: AIP Publishing 2020

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