An investigation into experimental in situ scanning electron microscope (SEM) imaging at high temperature
This paper presents an investigation into high temperature imaging of metals through the use of a novel heat stage for in situ Scanning Electron Microscopy (SEM). The results obtained demonstrate the benefits and challenges of SEM imaging at elevated temperatures of up to 850 °C using Secondary Elec...
| Հիմնական հեղինակներ: | , , , , , |
|---|---|
| Ձևաչափ: | Journal article |
| Լեզու: | English |
| Հրապարակվել է: |
AIP Publishing
2020
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