An investigation into experimental in situ scanning electron microscope (SEM) imaging at high temperature

An investigation into experimental in situ scanning electron microscope (SEM) imaging at high temperature

This paper presents an investigation into high temperature imaging of metals through the use of a novel heat stage for in situ Scanning Electron Microscopy (SEM). The results obtained demonstrate the benefits and challenges of SEM imaging at elevated temperatures of up to 850 °C using Secondary Elec...

Полное описание

Библиографические подробности
Главные авторы:	Heard, R, Huber, JE, Siviour, C, Edwards, G, Williamson-Brown, E, Dragnevski, K
Формат:	Journal article
Язык:	English
Опубликовано:	AIP Publishing 2020

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