High resolution x-ray characterization of Tl-2212 superconducting thin films

High resolution x-ray characterization of Tl-2212 superconducting thin films

Thallium based high temperature superconducting films were formed on LaAlO3 (LAO) substrates by thalliation of sputtered amorphous precursor films by reaction with Tl2O. High resolution strain measurements and diffraction topographic imaging studies were performed using the synchrotron at Stanford S...

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Bibliographic Details
Main Authors:	Daniels, M, Bilello, J, Rek, Z, Hyland, D, Dew-Hughes, D, Grovenor, C
Format:	Journal article
Language:	English
Published:	2001

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