Electron channelling contrast imaging of dislocation substructures in the vicinity of short fatigue cracks in Cu

Electron channelling contrast imaging of dislocation substructures in the vicinity of short fatigue cracks in Cu

Bibliografiske detaljer
Main Authors:	Ahmed, J, Wilkinson, A, Roberts, S, Hirsch, P
Format:	Conference item
Udgivet:	1998

Lignende værker

Examination of dislocation substructures in fatigued Cu using electron channelling contrast imaging
af: Ahmed, J, et al.
Udgivet: (1999)

Study of dislocation structures near fatigue cracks using electron channelling contrast imaging technique (ECCI).
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Electron channelling contrast imaging characterization of dislocation structures associated with extrusion and intrusion systems and fatigue cracks in copper single crystals
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THE EFFECTS OF SURFACE STRESS-RELAXATION ON ELECTRON CHANNELING CONTRAST IMAGES OF DISLOCATIONS
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Characterizing dislocation structures in bulk fatigued copper single crystals using electron channelling contrast imaging (ECCI)
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Udgivet: (1997)

Effects of surface relaxation on electron channelling contrast images of misfit dislocations
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Udgivet: (1994)

ELECTRON CHANNELING CONTRAST IMAGING (ECCI) OF DISLOCATIONS IN BULK SPECIMENS
af: Czernuszka, J, et al.
Udgivet: (1991)

Dislocation modelling of stage I fatigue crack growth
af: Wilkinson, A, et al.
Udgivet: (1999)

Characterizing dislocation structure evolution during cyclic deformation using electron channelling contrast imaging
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Udgivet: (2006)

Multiple scattering simulation of electron channelling contrast images of dislocations at interfaces
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Electron channeling and ion channeling contrast imaging of dislocations in nitride thin films
af: Trager-Cowan, C, et al.
Udgivet: (2008)

ELECTRON CHANNELING CONTRAST IMAGING OF DEFECTS IN SEMICONDUCTORS
af: Wilkinson, A, et al.
Udgivet: (1993)

A dislocation model for the two critical stress intensities required for threshold fatigue crack propagation
af: Wilkinson, A, et al.
Udgivet: (1996)

Electron backscatter diffraction and electron channeling contrast imaging of tilt and dislocations in nitride thin films
af: Trager-Cowan, C, et al.
Udgivet: (2007)

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af: Wilkinson, A, et al.
Udgivet: (1998)

DISLOCATIONS, CRACKS AND BRITTLENESS IN SINGLE-CRYSTALS
af: Roberts, S, et al.
Udgivet: (1993)

Decoherence in electron backscattering by kinked dislocations.
af: Dudarev, S, et al.
Udgivet: (1999)

Decoherence in electron backscattering by kinked dislocations
af: Dudarev, S, et al.
Udgivet: (1999)

The behaviour of short fatigue cracks /
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Udgivet: (1987)

DISLOCATION MOBILITY AND CRACK TIP PLASTICITY AT THE DUCTILE-BRITTLE TRANSITION
af: Hirsch, P, et al.
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DISLOCATION-DRIVEN STABLE CRACK-GROWTH BY MICROCLEAVAGE IN SEMIBRITTLE CRYSTALS
af: Hirsch, P, et al.
Udgivet: (1992)

THE DYNAMICS OF EDGE DISLOCATION GENERATION ALONG A PLANE ORTHOGONAL TO A MODE-I CRACK
af: Hirsch, P, et al.
Udgivet: (1989)

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Udgivet: (2002)

ELECTRON CHANNELING CONTRAST IMAGING OF INTERFACIAL DEFECTS IN STRAINED SILICON-GERMANIUM LAYERS ON SILICON
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A dislocation model of plasticity with particular application to fatigue crack closure
af: McKellar, D
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Udgivet: (2009)

Synchrotron based reciprocal space mapping and dislocation substructure analysis
af: Hofmann, F, et al.
Udgivet: (2009)

ANALYSIS OF DEFECTS IN BULK SEMICONDUCTORS USING ELECTRON CHANNELING CONTRAST IMAGING
af: Czernuszka, J, et al.
Udgivet: (1991)

ANALYSIS OF DEFECTS IN BULK SEMICONDUCTORS USING ELECTRON CHANNELING CONTRAST IMAGING
af: Czernuszka, J, et al.
Udgivet: (1991)

Simulations of electron diffraction contrast images of nanometer-sized dislocation loops
af: Zhou, Z, et al.
Udgivet: (2004)

TEM INVESTIGATION OF THE PLASTIC ZONE, DISLOCATION ROSETTES AND CRACKS AROUND VICKERS INDENTATIONS IN SILICON.
af: Samuels, J, et al.
Udgivet: (1985)

Probing deformation substructure by synchrotron X-ray diffraction and dislocation dynamics modelling.
af: Korsunsky, A, et al.
Udgivet: (2010)

TEM diffraction contrast images simulation of dislocations
af: WU, W., et al.
Udgivet: (2022)

TEM diffraction contrast images simulation of dislocations
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Controlled initiation of short fatigue cracks in 316L steel
af: Stefanescu, D, et al.
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Short fatigue cracks in austempered ductile cast iron (ADI)
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Cross-correlation based high resolution electron backscatter diffraction and electron channelling contrast imaging for strain mapping and dislocation distributions in InAlN thin films
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IMAGING OF DISLOCATIONS USING BACKSCATTERED ELECTRONS IN A SCANNING ELECTRON-MICROSCOPE
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