Structural study of two-dimensional semiconductors using four-dimensional scanning transmission electron microscopy

Structural study of two-dimensional semiconductors using four-dimensional scanning transmission electron microscopy

Graphene has shown superior mechanical properties, electronic and thermal conductivity, and room temperature quantum hall effect that enables its wide application in nanoelectronics. Due to its gapless feature, other two-dimensional (2D) materials like transition metal dichalcogenides (TMDs) have dr...

Disgrifiad llawn

Manylion Llyfryddiaeth
Prif Awdur:	Wen, Y
Awduron Eraill:	Warner, J
Fformat:	Traethawd Ymchwil
Iaith:	English
Cyhoeddwyd:	2021
Pynciau:	materials

Eitemau Tebyg

Uncovering material deformations via machine learning combined with four-dimensional scanning transmission electron microscopy
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Cyhoeddwyd: (2024)

Three-dimensional imaging using aberration-corrected scanning transmission and confocal electron microscopy
gan: Cosgriff, E, et al.
Cyhoeddwyd: (2008)

First-principles studies on the structure and electronic properties of two-dimensional semiconductors
gan: Tian, Yujia
Cyhoeddwyd: (2025)

Mapping nanoscale electrostatic field fluctuations around graphene dislocation cores using four-dimensional scanning transmission electron microscopy (4D-STEM)
gan: Coupin, MJ, et al.
Cyhoeddwyd: (2023)

High‐speed 4‐dimensional scanning transmission electron microscopy using compressive sensing techniques
gan: Robinson, AW, et al.
Cyhoeddwyd: (2024)

Atomic study of defects in two-dimensional transition metal chalcogenides using electron microscopy
gan: Chen, J
Cyhoeddwyd: (2020)

Image formation mechanisms in three-dimensional aberration-corrected scanning transmission electron microscopy
gan: Cosgriff, EC
Cyhoeddwyd: (2008)

Scanning confocal electron microscopy in a double aberration corrected transmission electron microscope
gan: Nellist, P, et al.
Cyhoeddwyd: (2008)

Density functional theory investigation of mechanical and electronic properties of two-dimensional semiconductors
gan: Kripalani, Devesh Raju
Cyhoeddwyd: (2021)

Three-Dimensional Crystal Structure Mapping by Diffractive Scanning Confocal Electron Microscopy (SCEM)
gan: Jones, L, et al.
Cyhoeddwyd: (2012)

Aberration-Corrected Imaging in Conventional Transmission Electron Microscopy and Scanning Transmission Electron Microscopy
gan: Kirkland, A, et al.
Cyhoeddwyd: (2008)

Correlative transmission electron microscopy and scanning electron microscopy of rabbit cornea.
gan: Othman, Fauziah, et al.
Cyhoeddwyd: (2010)

Z-contrast scanning transmission electron microscopy
gan: Pennycook, S, et al.
Cyhoeddwyd: (1999)

Atomic electrostatic maps of 1D channels in 2D semiconductors using 4D scanning transmission electron microscopy
gan: Fang, S, et al.
Cyhoeddwyd: (2019)

Scanning Electron-Microscopy (SEM) of lightweight alloys
gan: Tan, Wei Jian
Cyhoeddwyd: (2022)

Chapter 8 Aberration-Corrected Imaging in Conventional Transmission Electron Microscopy and Scanning Transmission Electron Microscopy
gan: Kirkland, A, et al.
Cyhoeddwyd: (2008)

Liquid-phase epitaxial growth of two-dimensional semiconductor hetero-nanostructures
gan: Tan, Chaoliang, et al.
Cyhoeddwyd: (2015)

Progress in aberration-corrected scanning transmission electron microscopy.
gan: Dellby, N, et al.
Cyhoeddwyd: (2001)

Light-tunable two-dimensional electronic devices
gan: Zhu, Chao
Cyhoeddwyd: (2020)

Improving carrier mobility in two-dimensional semiconductors with rippled materials
gan: Ng, Hong Kuan, et al.
Cyhoeddwyd: (2023)

The advantages of sub-sampling and Inpainting for scanning transmission electron microscopy
gan: Browning, ND, et al.
Cyhoeddwyd: (2023)

Scanning optical microscopy of semiconductor devices
gan: McCabe, E, et al.
Cyhoeddwyd: (1987)

Transmission electron microscopy investigation of semiconductor quantum dots
gan: Liao, X, et al.
Cyhoeddwyd: (2000)

Three-dimensional analysis of nanoparticles on carbon support using aberration-corrected scanning confocal electron microscopy
gan: Hashimoto, A, et al.
Cyhoeddwyd: (2012)

Applications of focal-series data in scanning-transmission electron microscopy
gan: Jones, L
Cyhoeddwyd: (2013)

Measuring dynamic structural changes of nanoparticles at the atomic scale using scanning transmission electron microscopy
gan: De Wael, A, et al.
Cyhoeddwyd: (2020)

Interfacing the One-Dimensional Scanning of an Image with the Applications of Two-Dimensional Operators
gan: Ullman, Shimon
Cyhoeddwyd: (2004)

Optical sectioning in the aberration-corrected scanning transmission and scanning confocal electron microscope
gan: Behan, G, et al.
Cyhoeddwyd: (2009)

Three-dimensional imaging and analysis by optical sectioning in the aberration-corrected scanning transmission and scanning confocal electron microscopes
gan: Nellist, P, et al.
Cyhoeddwyd: (2008)

3-DIMENSIONAL MEASUREMENT OF SHORT FATIGUE CRACKS USING SCANNING ACOUSTIC MICROSCOPY
gan: Knauss, D, et al.
Cyhoeddwyd: (1993)

Scanning electron microscopy
gan: 356151 Wells, Oliver C.
Cyhoeddwyd: (1974)

Three-dimensional imaging by optical sectioning in the aberration-corrected scanning transmission electron microscope.
gan: Behan, G, et al.
Cyhoeddwyd: (2009)

Three-dimensional optical transfer functions in the aberration-corrected scanning transmission electron microscope.
gan: Jones, L, et al.
Cyhoeddwyd: (2014)

Two-dimensional exploration of two-dimensional carbon : imaging and sensing applications
gan: Bardhan, Neelkanth Manoj
Cyhoeddwyd: (2016)

In Situ Scanning Transmission Electron Microscopy Observations of Fracture at the Atomic Scale
gan: Huang, Lingli, et al.
Cyhoeddwyd: (2021)

In Situ Scanning Transmission Electron Microscopy Observations of Fracture at the Atomic Scale
gan: Huang, Lingli, et al.
Cyhoeddwyd: (2022)

Cathodoluminescence of silicon doped aluminum nitride with scanning transmission electron microscopy
gan: Hauwiller, Matthew R, et al.
Cyhoeddwyd: (2022)

Transmission-scanning electron microscopy of interface fracture of ferrite deformation twins
gan: Koko, A, et al.
Cyhoeddwyd: (2024)

Scanning electro-microscopy of alloys
gan: Yong, Jovi Min
Cyhoeddwyd: (2019)

Transmission electron microscopy and diffractometry of materials /
gan: Fultz, B. (Brent), et al.
Cyhoeddwyd: (2008)